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Figure 6
(a) Back-reflection Laue pattern taken from the (0001) face of the quartz crystal in Fig. 4[link](a). Note that the specific [({\overline 1}2{\overline 1}0)] a face in Fig. 4[link](a), which is also the mirror plane A in Fig. S1 of the supporting information, is still perpendicular to the a2 axis here. (b) Simulated Laue pattern overlapped on the recorded one. The view direction is the same as that of Fig. 4[link](b), i.e. viewed from the backside of the CCD to the crystal surface along the −c direction. The range of colors of the spots from red to white indicates the decrease of intensity. Image width 94 mm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 1| February 2018| Pages 140-147
https://doi.org/10.1107/S1600576717018155
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