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Figure 5
Comparison between two fits for a PbTiO3 thin film on a (001)-oriented SrTiO3 substrate. The measurement is in red and the simulation in blue. The simulation in the top part is with a constant lattice parameter, while the bottom part corresponds to a depth-varying c-axis value described with an exponential function. The respective film lattice parameters are shown as insets. This clearly demonstrates a better agreement between the measurement and the simulation when the depth-varying c-axis value is chosen. From Weymann et al. (2018BB7).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 6| December 2018| Pages 1745-1751
https://doi.org/10.1107/S1600576718012840
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