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Figure 5
(a) 400 reflection from an irradiated yttria-stabilized zirconia single crystal with (100) orientation (circles: experimental data; line: calculation). (b) Corresponding strain (solid line) and Debye–Waller distribution (dotted line) below the surface. 200 slices were used to describe the 200 nm-thick strained region, which gives a 1 nm depth resolution.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 4| August 2019| Pages 882-897
https://doi.org/10.1107/S1600576719008471
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