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Figure 1
A summary of PDB depositions and crystallization methods from SMX experiments. (a) The frequency, plotted by year, of PDB depositions from serial experiments collected at XFEL and synchrotron light sources. PDB entries for this figure were selected on the basis of the number of reported crystals (>10), the reported radiation source and the indexing software used. The asterisk (*) indicates that the data from 2018BB1 are not complete. (b) A comparison of the crystallization methods used in the PDB as a whole (left) with the serial experiments identified in panel (a) (right) over the same time period.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 52| Part 6| December 2019| Pages 1385-1396
https://doi.org/10.1107/S1600576719013517
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