The following articles are a selection of those recently accepted for publication in Journal of Applied Crystallography.
See also Forthcoming articles in all IUCr journals.
Synopsis: The new release of many-functional computer program package WinXPRO v.3x for determination of the electron-density based crystal properties from parameters of the multipole model is described.
Synopsis: X-ray diffraction and analysis of computer simulated models are combined to study the dependence of presumed icosahedral order in a Cu-Zr-Al glass on the cooling rate at which the glasses are prepared. Significant correlations between of the fraction of icosahedral clusters and the applied cooling rate are reflected by changes of the total structure factor both for the simulated and the experimentally prepared systems.
Synopsis: Epitaxial layers of topological insulators of Bi2Te grown by molecular-beam epitaxy are investigated by high-resolution X-ray diffraction.
Synopsis: This article reports the integral transform that determines the particle size distribution from the small-angle scattering intensity under the assumption that the particle correlation function is a polynomial.
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