The following articles are a selection of those recently accepted for publication in Journal of Applied Crystallography.
See also Forthcoming articles in all IUCr journals.
Synopsis: A methodology to use a laboratory X-ray diffractometer equipped with an in-plane arm to determine residual stress gradients is presented. The approach is based on an in-plane arm rotation and a characterization of several reflections to achieve a variation of X-ray penetration depth even without a sample inclination. The proposed technique is applied to determine stress gradients in blasted hard TiN coatings.
Synopsis: A new model for the form factor of star polymers with excluded volume effect is presented.
Synopsis: This corrigendum replaces the first corrigendum [Popa & Balzar (2012). 45, 838-839], which was published to correct errors in the article by Popa & Balzar [J. Appl. Cryst. (2001), 34, 187-195].
Synopsis: The computer program, DPC toolkit, is a simple and user-friendly tool that identifies the unit cell lattice parameters of a crystal structure that is consistent with a given set of two-dimensional grazing-incidence wide-angle X-ray scattering data.
Synopsis: A new six-axis robotic sample changer for neutron powder diffraction experiments including texture measurements enabling a new set of experiments to be performed at the high-pressure preferred orientation diffractometer at the Lujan Neutron Scattering Center.
Synopsis: The new release of the multi-functional computer program package WinXPRO v.3x for determination of the electron-density-based crystal properties from parameters of the multipole model is described.
Synopsis: X-ray diffraction and analysis of computer-simulated models are combined to study the dependence of presumed icosahedral order in a Cu-Zr-Al glass on the cooling rate at which the glasses are prepared. Significant correlations between the fraction of icosahedral clusters and the applied cooling rate are reflected by changes of the total structure factor both for the simulated and the experimentally prepared systems.
Synopsis: The nominal pitch of 25 nm of a self-assembled block copolymer line grating was determined as 24.83 (9) nm by the first traceable grazing-incidence small-angle X-ray scattering measurements. Traceability is established by tracing all input parameters; the main contributions are the measurements of the sample-detector distance and of the pixel size.
Synopsis: Epitaxial layers of topological insulators of Bi2Te grown by molecular-beam epitaxy are investigated by high-resolution X-ray diffraction.
Synopsis: This article reports the integral transform that determines the particle size distribution from the small-angle scattering intensity under the assumption that the particle correlation function is a polynomial.
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