forthcoming articles

A computational and experimental investigation of integral X-ray diffuse scattering near Bragg reflections with a wide-open detector is presented for the case of small, circular, irradiation-induced dislocation loops in metals. The large-wavevector asymptotic power law falloff for such loops is determined computationally and incorporated into numerical and analytical integral X-ray diffuse scattering cross-section calculations. These calculations are shown to enable the experimental determination of the size distribution and concentrations of irradiation-induced dislocation loops in single crystalline tungsten.

The proposed Python library and graphical user interface (GUI) provide an open-source solution for crystal chemical analysis of both user data and published datasets. A user-friendly GUI ensures availability of the basic library features for crystallographers without programming skills, whereas more advanced use is possible for those familiar with Python.

This work provides practical information on the conventional top dusted sample preparation method and the top dusted adhesive tape sample preparation method. For the top dusted adhesive tape method, tapes with matte acetate or polyvinyl chloride backing are recommended as they cause a comparatively low background signal without high-intensity reflections.

To assess the performance of a double-crystal Laue-case monochromator, this study utilizes crystal simulation which integrates two diffraction profile calculation methods, two crystal depiction approaches and dual thermal distortion treatments. The thermal assessment effectively captures interior lattice plane distortions, enabling the simulation of crystal conditions closely matching actual scenarios.

A demonstration is given of the use of discrete and low-dimensional structure models within the periodic formalism of conventional Rietveld refinement software for the calculation of total scattering patterns.

This article describes a new phase identification algorithm called poly intended for spotty selected-area electron diffraction patterns collected from polymorphic nanomaterials. We have developed this new approach to determine the predominant high-pressure phases produced in laser-shock-affected regions of silicon. In this study, applying this algorithm allowed us to reliably identify two new t32-Si and t32*-Si phases and indicate their relaxation time in other metastable high-pressure silicon phases.

Here, precise background assessment and its application to single-crystal image compression and serial crystallography data pre-processing are presented.