forthcoming articles in Journal of Applied Crystallography

The following articles are a selection of those recently accepted for publication in Journal of Applied Crystallography.

See also Forthcoming articles in all IUCr journals.


Accepted 14 October 2014

Sample tilt-free characterization of residual stress gradients in tin coatings using an in-plane arm-equipped laboratory X-ray diffractometer

A. Benediktovitch, T. Ulyanenkova, J. Keckes and A. Ulyanenkov

Synopsis: A methodology to use a laboratory X-ray diffractometer equipped with an in-plane arm to determine residual stress gradients is presented. The approach is based on an in-plane arm rotation and a characterization of several reflections to achieve a variation of X-ray penetration depth even without a sample inclination. The proposed technique is applied to determine stress gradients in blasted hard TiN coatings.


Accepted 8 October 2014

A scattering function of star polymers including excluded volume effects

X. Li, C. Do, Y. Liu, L. Sánchez-Diáz, G. Smith and W.-R. Chen

Synopsis: A new model for the form factor of star polymers with excluded volume effect is presented.


Accepted 7 October 2014

Elastic strain and stress determination by Rietveld refinement: generalized treatment for textured polycrystals for all Laue classes. Second corrigendum

N. C. Popa and D. Balzar

Synopsis: This corrigendum replaces the first corrigendum [Popa & Balzar (2012). 45, 838-839], which was published to correct errors in the article by Popa & Balzar [J. Appl. Cryst. (2001), 34, 187-195].


Accepted 6 October 2014

Diffraction Pattern Calculator (DPC) toolkit: a user-friendly approach to unit-cell lattice parameter identification of two-dimensional grazing-incidence wide-angle X-ray scattering data

A. K. Hailey, A. M. Hiszpanski, D.-M. Smilgies and Y.-L. Loo

Synopsis: The computer program, DPC toolkit, is a simple and user-friendly tool that identifies the unit cell lattice parameters of a crystal structure that is consistent with a given set of two-dimensional grazing-incidence wide-angle X-ray scattering data.


Accepted 2 October 2014

Time-of-flight neutron powder diffraction with milligram samples: the crystal structures of NaCoF3 and NaNiF3 post-perovskites

A. Lindsay-Scott, D. Dobson, F. Nestola, M. Alvaro, N. Casati, C. Liebske, K. S. Knight, R. I. Smith and I. G. Wood


Accepted 2 October 2014

A six-axes robotic sample changer for high-throughput neutron powder diffraction and texture measurements

A. S. Losko, S. C. Vogel, H. M. Reiche and H. Nakotte

Synopsis: A new six-axis robotic sample changer for neutron powder diffraction experiments including texture measurements enabling a new set of experiments to be performed at the high-pressure preferred orientation diffractometer at the Lujan Neutron Scattering Center.


Accepted 29 September 2014

Developing WinXPRO: a software for determination of the multipole-model-based properties of crystals

A. I. Stash and V. G. Tsirelson

Synopsis: The new release of the multi-functional computer program package WinXPRO v.3x for determination of the electron-density-based crystal properties from parameters of the multipole model is described.


Accepted 24 September 2014

Full-field X-ray diffraction microscopy using polymeric compound refractive lenses

J. Hilhorst, F. Marschall, T. N. Tran Thi, A. Last and T. U. Schülli


Accepted 24 September 2014

Evidence for cooling-rate dependent icosahedral short-range order in a Cu-Zr-Al metallic glass

H. Hermann, U. Kühn, H. Wendrock, V. Kokotin and B. Schwarz

Synopsis: X-ray diffraction and analysis of computer-simulated models are combined to study the dependence of presumed icosahedral order in a Cu-Zr-Al glass on the cooling rate at which the glasses are prepared. Significant correlations between the fraction of icosahedral clusters and the applied cooling rate are reflected by changes of the total structure factor both for the simulated and the experimentally prepared systems.


Accepted 22 September 2014

Traceable GISAXS measurements for pitch determination of a 25 nm self-assembled polymer grating

J. Wernecke, M. Krumrey, A. Hoell, R. J. Kline, H.-K. Liu and W.-L. Wu

Synopsis: The nominal pitch of 25 nm of a self-assembled block copolymer line grating was determined as 24.83 (9) nm by the first traceable grazing-incidence small-angle X-ray scattering measurements. Traceability is established by tracing all input parameters; the main contributions are the measurements of the sample-detector distance and of the pixel size.


Accepted 22 September 2014

Self-organization of Fe clusters on mesoporous TiO2templates

P. Ziegler, N. Paul, P. Müller Buschbaum, B. Wiedemann, W. Kreuzpaintner, J. Jutimoosik, R. Yimnirun, A. Setzer, P. Esquinazi, P. Böni and A. Paul


Accepted 11 September 2014

Structure and composition of bismuth telluride topological insulators grown by molecular beam epitaxy

H. Steiner, V. Volobuev, O. Caha, G. Bauer, G. Springholz and V. Holý

Synopsis: Epitaxial layers of topological insulators of Bi2Te{}_{{3-\delta}} grown by molecular-beam epitaxy are investigated by high-resolution X-ray diffraction.


Accepted 10 September 2014

Generalization of the Fedorova-Schmidt method for determining particle size distributions

S. Ciccariello

Synopsis: This article reports the integral transform that determines the particle size distribution from the small-angle scattering intensity under the assumption that the particle correlation function is a polynomial.




































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