forthcoming articles in Journal of Applied Crystallography

The following articles are a selection of those recently accepted for publication in Journal of Applied Crystallography.

See also Forthcoming articles in all IUCr journals.


Accepted 24 May 2015

TEMPy: a Python Library for Assessment of 3D Electron Microscopy Density Fits

I. Farabella, D. Vasishtan, A. Joseph, A. P. Pandurangan, H. Sahota and M. Topf

Synopsis: TEMPy is an object-oriented Python library that provides the means to validate density fits in electron microscopy reconstructions. This article highlights several features of particular interest for this purpose and includes some customised examples.


Accepted 22 May 2015

Qu­antitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III-V photonics platform on silicon using a laboratory X-ray diffraction setup

Y. Ping Wang, A. Letoublon, T. Nguyen Thanh, M. Bahri, L. Largeau, G. Patriarche, C. Cornet, N. Bertru, A. Le Corre and O. Durand

Synopsis: A laboratory X-ray diffraction setup is reported, which allows quantitative characterization of the microtwin and antiphase domain densities in epitaxial GaP/Si thin layers.


Accepted 19 May 2015

Detection of medium-range-order structure in amorphous germanium film by spectroscopic ellipsometry

X.-D. Wang, B. Chen, H.-F. Wang, B. Chen, S.-J. Liu, Z.-X. Cui, B. Li, J.-B. Wang, S.-M. Wang and Y.-P. Li


Accepted 11 May 2015

A laboratory based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping

W. Whitley, C. Stock and A. Huxley

Synopsis: Apparatus is described for the purposes of automated grain-mapping polycrystalline samples within a laboratory environment, using a motorized sample stage and a CCD detector. The limitations that come from using a faster detector of relatively small surface are countered using an automated translation stage.


Accepted 11 May 2015

Three-dimensional reciprocal space mapping with a two-dimensional-detector as a low-latency tool for investigating the influence of growth parameters on defects in semipolar GaN

S. Bauer, S. Lazarev, M. Bauer, T. Meisch, M. Caliebe, V. Holy, F. Scholz and T. Baumbach


Accepted 7 May 2015

Crystallography of grain refinement in cast zinc-copper alloys

Z. Liu, D. Qiu, F. Wang, J. A. Taylor and M. Zhang

Synopsis: The grain-refining mechanism of cast zinc through copper inoculation is described, and the hexagonal close packing orientation relationship in zinc-copper alloys is identified using electron backscatter diffraction, an Euler-based numerical method and the edge-to-edge crystallographic matching model.


Accepted 22 April 2015

System for in situ observation of three-dimensional structural changes in polymer films during uniaxial deformation

T. Miyazaki, K. Shimokita, H. Ogawa and K. Yamamoto

Synopsis: This paper proposes a simple three-dimensional structural evaluation system for a film during uniaxial deformation. The two-dimensional patterns of small-angle X-ray scattering and wide-angle X-ray diffraction at the so-called edge and end views, and stress-strain data, can be obtained by this system during film stretching.


Accepted 20 April 2015

Laue pattern analysis for two-dimensional strain mapping in light ion implanted polycrystals

M. Ibrahim, É. Castelier, H. Palancher, M. Bornert, S. Caré and J.-S. Micha

Synopsis: Digital image analysis methods are developed to measure the strain in helium implanted polycrystals, from X-ray Laue patterns. Badly detected spots, fitting errors and low-accuracy results are automatically detected and eliminated using statistical tools based on least-squares fitting.


Accepted 19 April 2015

CRISTALES: a world to discover. An exhibition for schools and universities

J. M. Garcia-Ruiz, F. Otalora, A. Garcia-Caballero, L. A. González-Ramírez and C. Verdugo-Escamilla

Synopsis: CRISTALES: a world to discover is a teaching/outreach exhibition for schools and universities, offering a groundbreaking view of crystallography and its main contributions to society.


Accepted 26 March 2015

Monochromatic computed microtomography using laboratory and synchrotron sources and X-ray fluorescence analysis for comprehensive analysis of structural changes in bones

A. Buzmakov, M. Chukalina, D. Nikolaev, V. Gulimova, S. Saveliev, E. Tereschenko, A. Seregin, R. Senin, D. Zolotov, V. Prun, G. Shaefer and V. Asadchikov

Synopsis: Structural changes in vertebrate bone tissues caused by bone growth or by weightlessness were studied using a combination of X-ray tomography at different wavelengths and X-ray fluorescence analysis.




































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