forthcoming articles

The following articles are a selection of those recently accepted for publication in Journal of Applied Crystallography.

See also Forthcoming articles in all IUCr journals.

Accepted 19 August 2016

Towards high-flux X-ray beam compressing channel-cut monochromators

A high-flux Ge(111) X-ray beam compressing channel-cut monochromator with high compression ratio based on a strongly asymmetric diffraction was designed and successfully realized by a pilot application of the single-point diamond technology. Comparative testing of Ge(220) counterparts finished by traditional chemo-mechanical surface polishing demonstrates potential of the highly asymmetric compressor design and the new technology allowing its preparation with direct implications for high-throughput X-ray laboratory setups, in particular those with microfocus X-ray sources.

Accepted 17 August 2016

Evaluation of intragranular strain and average dislocation density in single grains of a polycrystal using K-map scanning

K-map scanning offers an excellent possibility for characterizing intragranular strains and average dislocation density in single grains of plastically deformed polycrystals.

Accepted 3 August 2016

Theoretical considerations on construction of hard x-ray resonators at inclined incidence with ultrahigh efficiency and resolution

A detailed consideration on how to construct inclined-incidence hard x-ray resonators is reported.

Accepted 29 July 2016

PyNX: Ptycho, computing library for X-ray coherent diffraction imaging of nanostructures

We present an open-source Python library PyNX.ptycho for the reconstruction of ptychographic data. This article includes example of analysis for both simulated and experimental data.

Accepted 28 July 2016

In-situ observation for the motion of ferroelectric domain walls in Bi4Ti3O12 single crystals

The motion of ferroelectric domain walls in ferroelectric Bi4Ti3O12 single crystal was in-situ observed under electron-beam irradiation in a transmission electron microscope. The migration of Ps(a)-90° DWs and the growth/annihilation of new needle-like Ps(a)-90° domains in a 20-μm-thick crystal were in-situ observed under applied electric field on a optical microscope.

Accepted 26 July 2016

Accepted 26 July 2016

Self-organized in-plane ordering of nanostructures at epitaxial ferroelectric ferromagnetic interfaces

Accepted 21 July 2016

Phase-targeted X-ray diffraction

A method to enhance the X-ray diffraction signal of a specific targeted crystalline phase within a sample is presented. This technique can be implemented in a handheld or in-line instrument format.

Accepted 21 July 2016

Qu­antitative characterization of the microstructure of heat-treated Zr-Excel by neutron line profile analysis

Heat treatments in the (α + β) or β-phase regime and subsequent cooling induce significant microstructural changes in Zr-Excel (Zr–3.5Sn–0.8Mo–0.8Nb) by generating nondiffusional complex martensitic products. In the current study it is shown how modern whole pattern diffraction line profile analysis (LPA) can individually characterize the defect structure of the martensitic and non-martensitic components of heat-treated Zr-Excel samples.

Accepted 20 July 2016

Morphology of Fe nanolayers with Pt overlayers on low-temperature annealing

Accepted 17 July 2016

Rapid measurement scheme for texture in cubic metallic materials using time-of-flight neutron diffraction at iMATERIA

A system for rapid texture measurement has been developed on the time-of-flight diffractometer iMATERIA, beamline BL 20, at MLF/J-PARC, Japan. Quantitative texture measurement for steel has become possible within a few minutes.

Accepted 15 July 2016

New insight on cubic–tetragonal–monoclinic phase transitions in ZrO2: ab initio study and symmetry analysis

A theoretical study of phase transitions in ZrO2 is presented.

Accepted 10 July 2016

US-SOMO HPLC-SAXS module: dealing with capillary fouling and extraction of pure component patterns from poorly resolved SEC-SAXS data

The US-SOMO HPLC-SAXS (high-performance liquid chromatography coupled with small-angle X-ray scattering) module is an advanced tool for the comprehensive analysis of SEC-SAXS (size-exclusion chromatography coupled with SAXS) data. It includes baseline and band-broadening correction routines, and Gaussian decomposition of overlapping skewed peaks into pure components.

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