An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films

Simbrunner, J.; Schrode, B.; Domke, J.; Fritz, T.; Salzmann, I.; Resel, R.

doi:10.1107/S2053273320001266

Acta Crystallographica Section A
Acta Crystallographica
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Figure 1
(a) Scattering geometry of a grazing-incidence X-ray diffraction experiment with a sample rotation around the angle φ_sample. (b) Trajectory of reciprocal-lattice points during the rotation of the sample around the angle φ_sample along concentric circles (blue lines) and two individual reciprocal-space maps at defined angles φ_sample.

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ISSN: 2053-2733

Volume 76| Part 3| May 2020| Pages 345-357

https://doi.org/10.1107/S2053273320001266

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