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Figure 2
(a) Section of the integrated pixel image with black markers indicating the peak positions obtained from the fitting process. (b) Intensities of peaks A, B and C of (c) as a function of the sample rotation angle φsample. (c) Integrated reciprocal-space map overlaid with the calculated peak positions of the determined crystal structure. The white box indicates the approximate section visualized in (a).

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ISSN: 2053-2733
Volume 76| Part 3| May 2020| Pages 345-357
https://doi.org/10.1107/S2053273320001266
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