An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films

Simbrunner, J.; Schrode, B.; Domke, J.; Fritz, T.; Salzmann, I.; Resel, R.

doi:10.1107/S2053273320001266

Acta Crystallographica Section A
Acta Crystallographica
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Figure 4
Positions of X-ray diffraction peaks (black) of pentacenequinone crystals grown on an Ag(111) surface obtained from rotating GIXD experiments. Top: q_y/q_x positions of the diffraction peaks; bottom: q_z/q_x positions. (a) Indexing (blue circles) of a single type of epitaxially oriented crystals grown with the (102) plane parallel to the substrate surface; (b) a second type of crystals grown with the (102) contact plane is indexed (red circles); (c) indexing of all 12 types of epitaxially oriented crystals.

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ISSN: 2053-2733

Volume 76| Part 3| May 2020| Pages 345-357

https://doi.org/10.1107/S2053273320001266

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