Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon

Kaganer, V.M.; Petrov, I.; Samoylova, L.

doi:10.1107/S2053273321003697

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 4
The dependence of the parameter $[\tilde{b}]$ given by equation (22)

on the distance L to a detector for the X-ray energy of 8 keV, bending radii $[R = \pm 0.1]$ m, and (a) Si(440) reflection at 10 µm crystal thickness and (b) C*(220) reflection at 20 µm crystal thickness.

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ISSN: 2053-2733

Volume 77| Part 4| July 2021| Pages 268-276

https://doi.org/10.1107/S2053273321003697

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