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Figure 4
The dependence of the parameter [\tilde{b}] given by equation (22)[link] on the distance L to a detector for the X-ray energy of 8 keV, bending radii [R = \pm 0.1] m, and (a) Si(440) reflection at 10 µm crystal thickness and (b) C*(220) reflection at 20 µm crystal thickness.

ISSN: 2053-2733
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