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Figure 5
Resolution curves for Fresnel diffraction at the X-ray energy of 8 keV for (a) Si(440) reflection, crystal thickness 10 µm, and (b) C*(220) reflection, crystal thickness 20 µm. Bending radius R = 0.1 m, distances to a detector 0.3, 0.6 and 1 m.

ISSN: 2053-2733
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