Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon

Kaganer, V.M.; Petrov, I.; Samoylova, L.

doi:10.1107/S2053273321003697

Acta Crystallographica Section A
Acta Crystallographica
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Figure 5
Resolution curves for Fresnel diffraction at the X-ray energy of 8 keV for (a) Si(440) reflection, crystal thickness 10 µm, and (b) C*(220) reflection, crystal thickness 20 µm. Bending radius R = 0.1 m, distances to a detector 0.3, 0.6 and 1 m.

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ISSN: 2053-2733

Volume 77| Part 4| July 2021| Pages 268-276

https://doi.org/10.1107/S2053273321003697

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