Universal simulation of absorption effects for X-ray diffraction in reflection geometry

Dallmann, J.; Graetz, J.; Hock, R.

doi:10.1107/S2053273324003292

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
Model of a 2D slice of the material distribution in a single-phase sample exhibiting porosity and surface roughness. Incoming and diffracted X-rays experience significantly different attenuations depending on the location of the scattering event, which ultimately leads to absorption effects.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 80| Part 4| July 2024| Pages 315-328

https://doi.org/10.1107/S2053273324003292

Open

access

Follow Acta Cryst. A

Search IUCr Journals		doi		Advanced search
Author		volume	page