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ISSN: 2053-2733

July 2024 issue

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Cover illustration: In this issue, Dallmann et al. [Acta Cryst. (2024), A80, 315–328] present a ray-tracing algorithm for the simulation of absorption effects in X-ray diffraction experiments in reflection geometry. The algorithm allows the calculation of absorption corrections for sample models with arbitrary microstructure in the form of surface roughness, waviness, porosity and particle distributions, as demonstrated by analyzing the absorption corrections resulting from surface models with roughness on various lateral and vertical length scales, as depicted in the cover image.

research papers


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The Liouville–Neumann-type series formalism is applied to solve the X-ray and electron boundary-value Cauchy problems formulated in the form of the matrix Volterra integral equation of the second kind. Using the two-stage resolvent solution of the second order, this approach is supported by straightforward calculation of the electron bright- and dark-field contrasts of the edge dislocation in a thick foil.

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A ray-tracing algorithm for the simulation of absorption effects for arbitrary rasterized samples is presented. The algorithm is used to analyze how the absorption correction is influenced by the lateral and vertical dimensions of the material distribution in a sample surface.

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This paper proposes a new order parameter model which satisfactorily explains complicated symmetry changes, the temperature–pressure (TP) phase diagram and elastic anomalies observed experimentally with the improper ferroelastic phase transitions in multiferroic KMnF3 single crystal.

crystal lattices


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Error-stable Bravais lattice determination algorithms for 2D and 3D lattices are presented.

short communications


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A method for the unambiguous description of the real octahedral crystal form using its five linear parameters is proposed. It can be considered as an alternative to other geometrical approaches to describe the shape of crystals.

book reviews


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