Bis(tetra­phenyl­phospho­nium) bis­[N-(octyl­sulfon­yl)dithio­carbimato(2–)-κ2S,S′]­nickelate(II)

Cunha, L.M.G.; Rubinger, M.M.M.; Oliveira, M.R.L.; Sabino, J.R.

doi:10.1107/S1600536807065014

Acta Crystallographica Section E
Acta Crystallographica
Section E CRYSTALLOGRAPHIC COMMUNICATIONS

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Figure 1 View of the dianion in (I) with 30% probability displacement ellipsoids showing atom labelling scheme. Symemtry operation (i): -x, y, −z + $[{1\over 2}]$ .

CRYSTALLOGRAPHIC
COMMUNICATIONS

ISSN: 2056-9890

Volume 64| Part 1| January 2008| Pages m148-m149

https://doi.org/10.1107/S1600536807065014

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