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Figure 4
Rietveld plot for the refinement of K3C6H5O7. The red crosses represent the observed data points, and the green line is the calculated pattern. The magenta curve is the difference pattern, plotted at the same scale as the other patterns. The vertical scale for angles > 44.0° has been multiplied by a factor of 5. The lower row of black tick marks indicates the reflection positions for the major phase and the upper row of red tick marks is for the silicon inter­nal standard.

Journal logoCRYSTALLOGRAPHIC
COMMUNICATIONS
ISSN: 2056-9890
Volume 72| Part 8| August 2016| Pages 1159-1162
https://doi.org/10.1107/S2056989016011506
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