Redetermination of the crystal structure of R5Si4 (R = Pr, Nd) from single-crystal X-ray diffraction data

Yokota, K.; Watanuki, R.; Nakashima, M.; Uehara, M.; Gouchi, J.; Uwatoko, Y.; Umehara, I.

doi:10.1107/S2056989020002789

Acta Crystallographica Section E
Acta Crystallographica
Section E CRYSTALLOGRAPHIC COMMUNICATIONS

IUCr IT WDC

home archive editors for authors for readers submit open access

view article

Figure 3
Polyhedral representation of the crystal structure of Pr₅Si₄ showing the Si–Si dimers situated in zigzag channels running along the [100] and [010] directions.

CRYSTALLOGRAPHIC
COMMUNICATIONS

ISSN: 2056-9890

Volume 76| Part 4| April 2020| Pages 510-513

https://doi.org/10.1107/S2056989020002789

Open

access

Follow Acta Cryst. E

Search IUCr Journals		doi		Advanced search
Author		volume	page