Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 2| Part 2

ISSN: 1600-5767

June 1969 issue

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research papers

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Revised X-ray diffraction line intensities for silicon carbide polytypes

A. L. Hannam and P. T. B. Shaffer

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Quantitative Zuordnung von röntgenographisch und mittels chemischer Ätzgruben erfassten Versetzungen bei einer Siliziumprobe

M. Renninger and W. Theis

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Refraction X par les trichites de cuivre

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Un nouvel aspect du calcul des distributions de tailles de particules en diffusion centrale des rayons X

H. Brusset and J. R. Donati

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A profile refinement method for nuclear and magnetic structures

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An X-ray method for the determination of domain size from the tails of diffraction profiles

I. S. Szántó and L. Varga

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Automatic pole figure evaluation

A. Segmüller and J. Angilello

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short communications

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A small set of reference crystals for double-crystal topography

R. D. Deslattes and B. Paretzkin

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Crystallographic indexing with a computer program modified for use with the IBM 360 O/S

H. J. Holland and J. A. Gawthrop

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X-ray study of the effect of palladium on stacking fault densities of Ag-base alloys

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Some comments on the methodology of line-broadening analyses

R. L. Rothman and J. B. Cohen

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Thermal expansion of yttrium and gadolinium iron, gallium and aluminum garnets

S. Geller, G. P. Espinosa and P. B. Crandall

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laboratory notes

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Practical experiments in crystallography; construction of a three-dimensional model

L. Bretherton and C. H. L. Kennard

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