Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 2
|
Part 6
ISSN: 1600-5767
December 1969 issue
research papers
J. Appl. Cryst.
(1969).
2
,
237-240
doi: 10.1107/S0021889869007126
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The identification of the crystal systems by the method of `constant parameters'
G. V. Davydov
and
V. M. Kharin
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J. Appl. Cryst.
(1969).
2
,
240-246
doi: 10.1107/S0021889869007138
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The intensity distribution and variance of the iron
K
α multiplet
H. J. Edwards
and
K. Toman
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J. Appl. Cryst.
(1969).
2
,
247-248
doi: 10.1107/S002188986900714X
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Errors in the bond method of lattice parameter determinations – further considerations
J. Burke
and
M. V. Tomkeieff
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J. Appl. Cryst.
(1969).
2
,
249-252
doi: 10.1107/S0021889869007151
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Plastic deformation in tungsten carbide
D. Lewis
and
L. J. Porter
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J. Appl. Cryst.
(1969).
2
,
252-254
doi: 10.1107/S0021889869007163
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The crystal structure of Ca
3
TeO
6
and Ca
3
WO
6
J. A. Baglio
and
S. Natansohn
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J. Appl. Cryst.
(1969).
2
,
254-259
doi: 10.1107/S0021889869007175
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Electronic measurement of electron microscope intensities and energies
G. R. Bradbury
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J. Appl. Cryst.
(1969).
2
,
259-261
doi: 10.1107/S0021889869007187
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Cathode ray tube display of automatically recorded pole figure data
A. Segmüller
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J. Appl. Cryst.
(1969).
2
,
262-273
doi: 10.1107/S0021889869007199
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Quantitative investigation of domain structures by Berg–Barrett X-ray diffraction microscopy. II. Identification of domains
K. Kranjc
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J. Appl. Cryst.
(1969).
2
,
273-281
doi: 10.1107/S0021889869007205
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The nickel-rich portion of the nickel–cadmium system
H. J. Goldschmidt
and
M. J. Walker
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J. Appl. Cryst.
(1969).
2
,
281-288
doi: 10.1107/S0021889869007217
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Axial thermal expansion of ZrO
2
and HfO
2
in the range room temperature to 1400°C
R. N. Patil
and
E. C. Subbarao
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J. Appl. Cryst.
(1969).
2
,
289-295
doi: 10.1107/S0021889869007229
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Slit smearing effects in the Bonse–Hart small-angle X-ray diffractometer
C. C. Gravatt
and
G. W. Brady
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J. Appl. Cryst.
(1969).
2
,
295-297
doi: 10.1107/S0021889869007230
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A method for determination of the rhombohedral angle of SbSn
C. A. MacKay
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J. Appl. Cryst.
(1969).
2
,
297-300
doi: 10.1107/S0021889869007242
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Tests of a Hankel transform method of determining electron densities of long cylinders from small-angle X-ray scattering data
R. D. Carlson
and
P. W. Schmidt
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short communications
J. Appl. Cryst.
(1969).
2
,
301-303
doi: 10.1107/S0021889869007254
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The lattice parameter and X-ray powder pattern of U
2
C
3
J. F. A. Hennecke
and
C. J. Toussaint
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crystal data
J. Appl. Cryst.
(1969).
2
,
303-304
doi: 10.1107/S0021889869007266
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Crystal data on two polymorphs of europium disilicate, Eu
2
Si
2
O
7
J. Felsche
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J. Appl. Cryst.
(1969).
2
,
305-306
doi: 10.1107/S0021889869007278
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Crystallography of (NH
4
)
3
SiF
6
NO
3
G. H. McClellan
,
K. R. Waerstad
and
A. W. Frazier
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J. Appl. Cryst.
(1969).
2
,
306-307
doi: 10.1107/S002188986900728X
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X-ray data for triammonium tetrametaphosphate monohydrate
K. R. Waerstad
,
G. H. McClellan
,
A. W. Frazier
and
R. C. Sheridan
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laboratory notes
J. Appl. Cryst.
(1969).
2
,
307-308
doi: 10.1107/S0021889869007291
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Increasing the versatility of the Picker X-ray diffractometer
A. Kidron
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J. Appl. Cryst.
(1969).
2
,
308-309
doi: 10.1107/S0021889869099985
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Flat film Weissenberg attachment for the Polaroid XR-7 cassette
H. Hope
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book reviews
J. Appl. Cryst.
(1969).
2
,
310
doi: 10.1107/S0021889869007308
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Free
Liquid crystals. Proceedings of the International Conference on Liquid Crystals, Kent State University, August 16-20, 1965
edited by G. H. Brown, G. J. Dienes and M. M. Labes
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J. Appl. Cryst.
(1969).
2
,
310-311
doi: 10.1107/S002188986900731X
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The monthly American journal of geology and natural science
edited by G. W. Featherstonhaugh
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J. Appl. Cryst.
(1969).
2
,
311
doi: 10.1107/S0021889869007321
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Optical properties of solids
edited by S. Nudelmann and S. S. Mitra
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notes and news
J. Appl. Cryst.
(1969).
2
,
311-312
doi: 10.1107/S0021889869007333
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Notes and News
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international union of crystallography
J. Appl. Cryst.
(1969).
2
,
312
doi: 10.1107/S0021889869007345
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Commission on Crystallographic Apparatus
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