Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 5| Part 5

ISSN: 1600-5767

October 1972 issue

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research papers

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A method for aligning crystals in precession photography using monochromated radiation

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A unified theory of absolute intensity measurements in small-angle X-ray scattering

R. W. Hendricks

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Effects of porosity and surface roughness on the X-ray intensity reflected from a powder specimen

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Precession photography: general transformation equations and a new alignment method

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Guinier camera for single crystal investigation

H. Dachs and K. Knorr

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Quantitative analysis of phase composition using X-ray diffraction methods

A. J. Majumdar, L. S. Vallance and C. G. G. Born

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On the phase transformation in cadmium iodide polytypic crystals

R. S. Tiwari and O. N. Srivastava

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Etude des profils de raies de diffraction des rayons X d'une poudre d'hydroxyde de nickel

D. Louër, D. Weigel and J. I. Langford

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The relation of physical properties to the symmetry of potassium iodate

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The use of standard deviation of X-ray diffraction lines as a measure of broadening in the Scherrer equation: a curve fitting method

R. McGehee and J. Renault

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K vivodu formuli dlya krivoy profilya istinnogo raspredeleniya intensivnosti po uglam rasseyaniya, obuslovlennoy faktorami razmera i formi oblastey kogerentnogo rasseyaniya

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short communications

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On the enhanced small-angle X-ray scattering from polished surfaces of aluminum

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Production of sensitive converter screens for thermal neutron diffraction patterns

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Radiation hazards from X-ray diffraction equipment

C. Faloci, A. Susanna and F. Zampini

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crystal data

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Crystal data for samarium, holmium and lutetium iron garnets

G. J. McCarthy, R. Botdorf and G. G. Johnson Jnr

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Crystal data for potassium sodium silicofluoride, K₂SiF₆.Na₂SiF₆

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Crystal data on mercury picramate, Hg[C₆H₂(NO₂)₂(NH₂)O]₂.H₂O

S. P. Agrawal and B. D. Agrawal

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computer programs

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A computer program for the separation of linearly sloping backgrounds in X-ray line broadening analysis

D. R. Lundy and E. D. Eanes

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laboratory notes

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A method of preparation of powder samples for Debye–Scherrer–Hull X-ray diffraction

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Practical experiments in crystallography. Structure solution using `Patterson' heavy-atom technique

C. H. L. Kennard

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Practical experiments in crystallography: simulation of structure-factor and one-dimensional electron-density calculations

C. H. L. Kennard

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international union of crystallography

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Commission on Neutron Diffraction

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notes and news

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Notes and News

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crystallographers

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Crystallographers

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book reviews

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Landolt–Börnstein. Numerical data and functional relationships in science and technology. Group III. Vol. 6. Structure data of elements and intermetallic phases edited by K.-H. Hellwege

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The Physics of Metals and Metallography edited by S. V. Vonsovsky

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Hydrothermal synthesis of crystals edited by A. N. Lobachev

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Tables for microscopic identification of ore materials by W. Uytenbogaardt and E. A. J. Burke

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Polarization interferometers: applications in microscopy and macroscopy by M. Françon and S. Mallick

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Principles and Practice of X-ray Spectrometric Analysis by E. P. Bertin

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books received

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Optical microscopy for the materials sciences by J. H. Richardson

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Handbook of electronic materials. Vol. 6. Silicon nitride for microelectronic applications, Part 2 by J. T. Milek

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