Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 10
|
Part 3
ISSN: 1600-5767
June 1977 issue
research papers
J. Appl. Cryst.
(1977).
10
,
137-140
doi: 10.1107/S0021889877013120
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On Soulé-Porod plots of protein X-ray scattering data
N. S. Murthy
and
J. R. Knox
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J. Appl. Cryst.
(1977).
10
,
141-146
doi: 10.1107/S0021889877013132
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Paracrystalline nature of myelin
A. Hybl
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J. Appl. Cryst.
(1977).
10
,
147-150
doi: 10.1107/S0021889877013144
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A method of quantitative phase analysis without standards
L. S. Zevin
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J. Appl. Cryst.
(1977).
10
,
151-155
doi: 10.1107/S0021889877013156
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Etude
in situ
par diffusion centrale des rayons X d'une faible addition de Mg sur les mécanismes de précipitation d'un alliage Al–15% Zn en poids
A. M. Flank
and
A. Naudon
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J. Appl. Cryst.
(1977).
10
,
156-166
doi: 10.1107/S0021889877013168
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Photographing the reciprocal lattice with the axis of the film cylinder intersecting the rotation axis of the crystal at 45°
C. Chieh
,
R. Stokhuyzen
and
A. Beck
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J. Appl. Cryst.
(1977).
10
,
167-171
doi: 10.1107/S002188987701317X
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High-pressure neutron diffraction study of Si
2
N
2
O
S. R. Srinivasa
,
L. Cartz
,
J. D. Jorgensen
,
T. G. Worlton
,
R. A. Beyerlein
and
M. Billy
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J. Appl. Cryst.
(1977).
10
,
172-176
doi: 10.1107/S0021889877013181
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The small-angle scattering of neutrons by surface imperfections
M. Roth
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J. Appl. Cryst.
(1977).
10
,
177-179
doi: 10.1107/S0021889877013193
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Intensity measurements of twinned or grown-together crystals on single-crystal diffractometers
W. Denner
,
H. d'Amour
,
H. Schulz
and
W. Stoeger
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J. Appl. Cryst.
(1977).
10
,
180-183
doi: 10.1107/S002188987701320X
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Temperature dependence of the orthorhombic asymmetry of gallium metal
W. H. Haemmerle
and
J. B. Lastovka
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J. Appl. Cryst.
(1977).
10
,
184-190
doi: 10.1107/S0021889877013211
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X-ray line-profile analysis. I. A method for unfolding diffraction profiles
B. Moraweck
,
Ph. de Montgolfier
and
A. J. Renouprez
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J. Appl. Cryst.
(1977).
10
,
191-196
doi: 10.1107/S0021889877013223
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X-ray line-profile analysis. II. Determination of the crystallite-diameter distribution function
B. Moraweck
,
Ph. de Montgolfier
and
A. J. Renouprez
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J. Appl. Cryst.
(1977).
10
,
197-199
doi: 10.1107/S0021889877013235
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Equipping a four-circle single-crystal diffractometer with an interchangeable Si(Li) solid-state detector
D. F. Grant
,
E. J. Lisher
and
R. H. Mitchell
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crystal data
J. Appl. Cryst.
(1977).
10
,
200
doi: 10.1107/S0021889877013247
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Données cristallo-chimiques sur le tétrapolyphosphate mixte de germanium et ammonium: (NH
4
)
2
GeP
4
O
13
M. T. Averbuch-Pouchot
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J. Appl. Cryst.
(1977).
10
,
201-202
doi: 10.1107/S0021889877013259
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Crystal data for methylammonium manganese(II) trichloride dihydrate, CH
3
NH
3
MnCl
3
.2H
2
O
W. Bachmann
,
H. R. Oswald
and
J. R. Günter
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J. Appl. Cryst.
(1977).
10
,
202
doi: 10.1107/S0021889877013260
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Relations structurales entre GeS
2
et GeS
2
-H.T.
E. Godlewski
and
P. Laruelle
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J. Appl. Cryst.
(1977).
10
,
203-205
doi: 10.1107/S0021889877013272
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Crystal data for two series of solid solutions: (Rb
x
K
1−
x
) Ag
4
I
5
and (RB
x
K
1−
x
)
2
AgI
3
L. Bonpunt
,
Y. Obaid
and
Y. Haget
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computer programs
J. Appl. Cryst.
(1977).
10
,
206-208
doi: 10.1107/S0021889877013284
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A Fortran computer program to collect X-ray diffraction data on macromolecules
R. L. Girling
,
M. K. Wood
and
E. E. Abola
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laboratory notes
J. Appl. Cryst.
(1977).
10
,
208
doi: 10.1107/S0021889877013296
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A new single-crystal heater for the kappa diffractometer
C. E. Rice
and
W. R. Robinson
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J. Appl. Cryst.
(1977).
10
,
208-209
doi: 10.1107/S0021889877013302
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A portable apparatus for mounting air-sensitive crystals
G. A. Rodley
and
Y. S. Ng
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letters to the editor
J. Appl. Cryst.
(1977).
10
,
209-210
doi: 10.1107/S0021889877013314
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The proper description of low-temperature X-ray diffraction apparatus
R. Rudman
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crystallographers
J. Appl. Cryst.
(1977).
10
,
210
doi: 10.1107/S0021889877013326
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1977).
10
,
211
doi: 10.1107/S0021889877013338
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Establishment of a President's Fund
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J. Appl. Cryst.
(1977).
10
,
211
doi: 10.1107/S002188987701334X
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International Tables for X-ray Crystallography
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notes and news
J. Appl. Cryst.
(1977).
10
,
211
doi: 10.1107/S0021889877013351
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Notes and News
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book reviews
J. Appl. Cryst.
(1977).
10
,
211-212
doi: 10.1107/S0021889877013363
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Characterisation of epitaxial semiconductor films
edited by H. Kressel
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J. Appl. Cryst.
(1977).
10
,
212
doi: 10.1107/S0021889877013375
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Vapour growth and epitaxy
edited by G. W. Cullen, E. Kaldis, R. L. Parker and C. J. M. Rooymans
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books received
J. Appl. Cryst.
(1977).
10
,
212
doi: 10.1107/S0021889877013387
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Developments in electron microscopy and analysis
edited by J. A. Venables
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