Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 10
|
Part 5
ISSN: 1600-5767
October 1977 issue
research papers
J. Appl. Cryst.
(1977).
10
,
369-371
doi: 10.1107/S0021889877013788
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Multiple diffraction in spinel and the space-group ambiguity
P. Thompson
and
N. W. Grimes
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J. Appl. Cryst.
(1977).
10
,
372-375
doi: 10.1107/S002188987701379X
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Contribution de la diffraction neutronique à l'étude de la fonction texture du titane recristallisé, comparaison avec le diffraction des rayons X
J. P. Mardon
,
M. Pernot
,
P. Dervin
,
R. Penelle
and
M. Englander
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J. Appl. Cryst.
(1977).
10
,
376-385
doi: 10.1107/S0021889877013806
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A general method for locating the X-ray source point in Kossel diffraction
S. Biggin
and
D. J. Dingley
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J. Appl. Cryst.
(1977).
10
,
386-389
doi: 10.1107/S0021889877013818
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A computer-controlled X-ray powder diffraction system with an automatic sample changer
H. J. Holland
and
R. C. Medrud
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J. Appl. Cryst.
(1977).
10
,
390-396
doi: 10.1107/S002188987701382X
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X-ray diffraction profiles fron neutron-irradiated LiF single crystals
C. A. Pimentel
and
S. Caticha-Ellis
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J. Appl. Cryst.
(1977).
10
,
397-400
doi: 10.1107/S0021889877013831
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The limit of detection of amosite in two forms of calcium silicate matrix
J. W. Critchell
and
P. E. J. Flewitt
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J. Appl. Cryst.
(1977).
10
,
401-404
doi: 10.1107/S0021889877013843
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X-ray line-broadening studies on austenitic stainless steel filings
P. K. Nair
and
R. Vasudevan
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J. Appl. Cryst.
(1977).
10
,
405-411
doi: 10.1107/S0021889877013855
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Profile analysis of X-ray powder diffractometer data: structural refinement of La
0.75
Sr
0.25
CrO
3
C. P. Khattak
and
D. E. Cox
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J. Appl. Cryst.
(1977).
10
,
412-414
doi: 10.1107/S0021889877013867
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Low-angle X-ray scattering with C
K
α radiation
O. Aita
,
H. Fujimoto
,
C. Sugiura
and
Y. Siota
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J. Appl. Cryst.
(1977).
10
,
415-421
doi: 10.1107/S0021889877013879
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A new method for the evaluation of small-angle scattering data
O. Glatter
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J. Appl. Cryst.
(1977).
10
,
422-425
doi: 10.1107/S0021889877013880
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The use of integrals of the Airy diffraction intensity profile in X-ray topography of `spike' diffuse reflexions
M. Moore
and
A. R. Lang
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J. Appl. Cryst.
(1977).
10
,
426-429
doi: 10.1107/S0021889877013892
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A pattern-recognition procedure for scanning oscillation films
W. Kabsch
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crystallographers
J. Appl. Cryst.
(1977).
10
,
430
doi: 10.1107/S0021889877013909
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