Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 12| Part 4

ISSN: 1600-5767

August 1979 issue

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research papers

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On the estimation of the locations of subunits within macromolecular aggregates from neutron interference data

P. B. Moore and E. Weinstein

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Non-destructive investigation of texture by neutron diffraction

C. S. Choi, H. J. Prask and S. F. Trevino

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Détermination expérimentale de la fonction d'orientation – son application dans le calcul des bandes de diffraction

J. de Courville, D. Tchoubar and C. Tchoubar

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Geometrical problems with a position-sensitive detector employed on a diffractometer, including its use in the measurement of stress

M. R. James and J. B. Cohen

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Diffracted beam–transmitted beam Borrmann X-ray topography in copper. A novel method of stereo depth topography

G. P. Hamill and T. Vreeland Jnr

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Determination of local atomic configurations for binary substitutional alloys

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Simple methods of aligning four-circle diffractometers with crystal reflections

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Tie lines in a two-phase region in the Cu–Ni–Zn system

O. S. Mayall and A. Mathew

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Voigt function fit of X-ray and neutron powder diffraction profiles

P. Suortti, M. Ahtee and L. Unonius

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Accurate X-ray determination of the lattice parameters and the thermal expansion coefficients of VO₂ near the transition temperature

D. Kucharczyk and T. Niklewski

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Diffracted beam crystal centering and its application to high-pressure crystallography

H. E. King Jnr and L. W. Finger

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An analytical method for the determination of the geometric and kinetic features of growing crystal faces

M. Rubbo and D. Aquilano

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Lattice parameter, microstrains and non-stoichiometry in NiO. Comparison between mosaic microcrystals and quasi-perfect single microcrystals

F. Fiévet, P. Germi, F. de Bergevin and M. Figlarz

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short communications

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Confirmation and complementation of the conclusions from small-angle X-ray scattering of cellulose by direct electron-microscope observations

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Can metastable crystal forms `disappear'?

V. W. Jacewicz and J. H. C. Nayler

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`Randomness' in multiphase X-ray scatterers

J. Goodisman and H. Brumberger

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Total thermal neutron cross sections of Al, Si, Cu, Zn, Ge, Pb and Bi single crystals

B. Grabcev, S. Todireanu and V. Cioca

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Absorption correction and normalization of X-ray small-angle scattering data for materials producing intense scattering at extremely low angles

C. W. Dwiggins Jnr

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A simple furnace for neutron diffraction studies

F. P. Bailey and C. E. G. Bennett

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crystal data

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Crystal data for Na₄Mg₂Si₃O₁₀

C. M. Foris, F. C. Zumsteg and R. D. Shannon

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Powder diffraction data for compounds in the series Na_x(Ca_3±xNa_x)Al₂O₆

F. Cervantes Lee and F. P. Glasser

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Rare-earth trihydroxide parameters

W. O. Milligan, D. F. Mullica and J. D. Oliver

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Crystal data and molecular packing of drug charge-transfer complexes. I. Promethazine picrate

B. Narayana Achar and J. Shashidhara Prasad

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Crystal data of tris(2-cyanoethyl)phosphine oxide, tris(2-cyanoethyl)phosphine sulphide and tris(2-cyanoethyl)phosphine selenide

A. J. Blake, R. A. Howie and G. P. McQuillan

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Revised and new crystal data for indium selenides

S. Popović, A. Tonejc, B. Gržeta-Plenković, B. Čelustka and R. Trojko

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Crystal data for cis and trans-dichlorobis(imidazole)palladium(II)

M. C. Navarro Ranninger

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Crystal data for PbGe[Ge₃O₉](h)

H. H. Otto and A. Dietrich

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computer programs

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Plot of packing program POP1

B. W. van de Waal

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laboratory notes

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A microprocessor-controlled optical incremental angle encoder system for the Picker FACS-I diffractometer

R. F. Wrenn, P. H. Bethge and F. S. Mathews

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A miniature device for compressive stress application

S. C. Abrahams and J. L. Bernstein

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meeting reports

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Computer programming for protein crystallographic applications, University of California at San Diego, 28–29 November 1978

S. T. Freer and J. Stewart

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crystallographers

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Crystallographers

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book reviews

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Space groups for solid state scientists by G. Burns and A. M. Glazer

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Glass, 1977 edited by Götz Götz

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