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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 12
|
Part 6
ISSN: 1600-5767
December 1979 issue
lead articles
J. Appl. Cryst.
(1979).
12
,
489-501
doi: 10.1107/S0021889879013169
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The influence of multiaxial stress states, stress gradients and elastic anisotropy on the evaluation of (Residual) stresses by X-rays
H. Dölle
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research papers
J. Appl. Cryst.
(1979).
12
,
502-510
doi: 10.1107/S0021889879013170
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Etude d'un systeme micellaire de type inverse par diffusion centrale des neutrons
C. Cabos
and
P. Delord
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J. Appl. Cryst.
(1979).
12
,
511-516
doi: 10.1107/S0021889879013182
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Pressure-induced tetrahedral tilting and deformation in Ge
2
N
2
O
S. R. Srinivasa
,
L. Cartz
,
J. D. Jorgensen
and
J. C. Labbe
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J. Appl. Cryst.
(1979).
12
,
517-524
doi: 10.1107/S0021889879013194
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Determination of inter-element effects through Monte Carlo simulation of X-ray fluorescence
H. A. Fine
and
F. L. Benitez-Garcia
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J. Appl. Cryst.
(1979).
12
,
525-530
doi: 10.1107/S0021889879013200
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The determination of crystallite dimensions using synchrotron-radiation X-ray diffraction photographs
Z. H. Kalman
,
I. T. Steinberger
and
S. S. Hasnain
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J. Appl. Cryst.
(1979).
12
,
531-536
doi: 10.1107/S0021889879013212
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Quantitative structural studies by means of the energy-dispersive method with X-rays from a storage ring
B. Buras
,
L. Gerward
,
A. M. Glazer
,
M. Hidaka
and
J. Staun Olsen
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J. Appl. Cryst.
(1979).
12
,
537-544
doi: 10.1107/S0021889879013224
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A liquid-helium cryostat for collection of three-dimensional X-ray intensity data down to 20 K. The crystal structure of
D
(+)-tartaric acid at 35, 105, 160 and 295 K
J. Albertsson
,
Å. Oskarsson
and
K. Ståhl
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J. Appl. Cryst.
(1979).
12
,
545-550
doi: 10.1107/S0021889879013236
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X-ray diffraction profiles from single crystals of Cu–Ge alloy containing heavily faulted regions
T. Takama
,
N. Yokota
and
S. Sato
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J. Appl. Cryst.
(1979).
12
,
551-553
doi: 10.1107/S0021889879013248
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Analysis of two-dimensional reflections from a fine-particle carbon
R. Caminiti
,
G. Licheri
,
G. Piccaluga
and
L. Schiffini
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J. Appl. Cryst.
(1979).
12
,
554-563
doi: 10.1107/S002188987901325X
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An analysis of the Rietveld refinement method
M. Sakata
and
M. J. Cooper
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J. Appl. Cryst.
(1979).
12
,
564-569
doi: 10.1107/S0021889879013261
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A texture goniometer with variable radius and collimation for analysis of textures in rocks
M. T. Frost
and
A. W. B. Siddans
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J. Appl. Cryst.
(1979).
12
,
570-581
doi: 10.1107/S0021889879013273
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Processing and post-refinement of oscillation camera data
M. G. Rossmann
,
A. G. W. Leslie
,
S. S. Abdel-Meguid
and
T. Tsukihara
Read article
J. Appl. Cryst.
(1979).
12
,
582-584
doi: 10.1107/S0021889879013285
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Methods of mixing in quantitative X-ray phase analysis
L. S. Zevin
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J. Appl. Cryst.
(1979).
12
,
585-588
doi: 10.1107/S0021889879013297
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A method of reducing termination errors in radial distribution functions
R. Narayan
and
S. Ramaseshan
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J. Appl. Cryst.
(1979).
12
,
589-591
doi: 10.1107/S0021889879013303
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The crystal structure of cotton cellulose investigated by an electron diffraction technique
K. M. Paralikar
,
S. M. Betrabet
and
N. V. Bhat
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J. Appl. Cryst.
(1979).
12
,
592-600
doi: 10.1107/S0021889879013315
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A four-circle diffractometer on a focused, tuneable synchrotron radiation source: mechanical design, computer control and evaluation of system performance
J. C. Phillips
,
J. A. Cerino
and
K. O. Hodgson
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short communications
J. Appl. Cryst.
(1979).
12
,
601-602
doi: 10.1107/S0021889879013327
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Profile refinement of multiple-wavelength neutron powder data
P. W. De Haven
and
R. A. Jacobson
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J. Appl. Cryst.
(1979).
12
,
603-604
doi: 10.1107/S0021889879013339
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Thermal expansion of the disordered form of 2-fluoronaphthalene (form I)
A. Meresse
,
Y. Haget
,
A. Filhol
and
N. B. Chanh
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crystal data
J. Appl. Cryst.
(1979).
12
,
605
doi: 10.1107/S0021889879013340
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Données crystallographiques sur le dichromate d'ammonium et de cadmium dihydraté, Cd(NH
4
)
2
(Cr
2
O
7
)
2
.2H
2
O
D. Blum
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J. Appl. Cryst.
(1979).
12
,
606
doi: 10.1107/S0021889879013352
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Données cristallographiques sur le dichromate de cuivre dihydraté CuCr
2
O
7
.2H
2
O
D. Blum
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J. Appl. Cryst.
(1979).
12
,
607
doi: 10.1107/S0021889879013364
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Données cristallographiques sur la forme hexagonale du trichromate de rubidium: Rb
2
Cr
3
O
10
D. Blum
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J. Appl. Cryst.
(1979).
12
,
608
doi: 10.1107/S0021889879013376
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Données cristallographiques sur la forme hexagonale du trichromate d'ammonium, (NH
4
)
2
Cr
3
O
10
D. Blum
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J. Appl. Cryst.
(1979).
12
,
608-609
doi: 10.1107/S0021889879013388
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Données cristallographiques sur le tétrachromate d'ammonium (NH
4
)
2
Cr
4
O
13
D. Blum
and
D. Tran Qui
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J. Appl. Cryst.
(1979).
12
,
609-610
doi: 10.1107/S002188987901339X
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Etude cristallographique des monophosphates acides du type
M
II
(H
2
PO
4
)
2
.2H
2
O pour
M
II
=Mn
II
, Fe
II
, Co
II
A. Boudjada
and
A. Durif
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J. Appl. Cryst.
(1979).
12
,
611
doi: 10.1107/S0021889879013406
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Crystal data for ammonium magnesium carbonate tetrahydrate [(NH
4
)
2
Mg(CO
3
)
2
.4H
2
O]
E. Erdös
,
H. Altorfer
and
J. Witt
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J. Appl. Cryst.
(1979).
12
,
612
doi: 10.1107/S0021889879013418
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Crystal data for pipemidic acid trihydrate C
14
H
17
N
5
O
3
.3H
2
O
R. Ceolin
,
F. Clanet
,
G. Ghemard
,
C. Souleau
and
P. Khodadad
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J. Appl. Cryst.
(1979).
12
,
613-614
doi: 10.1107/S002188987901342X
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Crystal data for sodium propanoate: C
2
H
5
COONa
V. Massarotti
and
G. Spinolo
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J. Appl. Cryst.
(1979).
12
,
615
doi: 10.1107/S0021889879013431
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Données crystallographiques sur la forme basse température de (NH
4
)
3
In(SO
4
)
3
G. Laplace
and
B. Jolibois
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J. Appl. Cryst.
(1979).
12
,
616
doi: 10.1107/S0021889879013443
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New crystal data for Ca, Cu, UO
2
hydrated carbonate: voglite
P. Piret
and
M. Deliens
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J. Appl. Cryst.
(1979).
12
,
617-618
doi: 10.1107/S0021889879013455
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Crystal data for N(CH
3
)
4
GeCl
3
A. Möller
and
J. Felsche
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J. Appl. Cryst.
(1979).
12
,
618
doi: 10.1107/S0021889879013467
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Lattice parameters and space group of ethyl-4-acetoxy-5-methoxy-8-bromo-2-naphthoate (C
16
H
15
BrO
5
)
M. R. Hussain
,
A. Hussain
and
B. R. Rao
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J. Appl. Cryst.
(1979).
12
,
619-621
doi: 10.1107/S0021889879013479
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Crystal data for room temperature PuGa
R. B. Roof
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J. Appl. Cryst.
(1979).
12
,
621-622
doi: 10.1107/S0021889879013480
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Crystal data for α-iminodiacetic acid
M. Delfino
,
J. A. Nicolosi
and
J. Ladell
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J. Appl. Cryst.
(1979).
12
,
623-626
doi: 10.1107/S0021889879013492
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Revised crystal data for the aluminate sodalite Ca
8
[Al
12
O
24
](WO
4
)
2
W. Depmeier
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J. Appl. Cryst.
(1979).
12
,
626-627
doi: 10.1107/S0021889879013509
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Crystal data for a second polymorph (β) of C.I. Pigment Red 1,1-[(4-nitrophenyl)azo]-2-naphthol
A. Whitaker
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computer programs
J. Appl. Cryst.
(1979).
12
,
628
doi: 10.1107/S0021889879013510
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Curve analysis of small-angle scattering by triaxial body models using a graphic display device
Y. Hiragi
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J. Appl. Cryst.
(1979).
12
,
629-634
doi: 10.1107/S0021889879013522
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A search–match system for X-ray powder diffraction data
R. G. Marquart
,
I. Katsnelson
,
G. W. A. Milne
,
S. R. Heller
,
G. G. Johnson Jnr
and
R. Jenkins
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J. Appl. Cryst.
(1979).
12
,
634-635
doi: 10.1107/S0021889879013534
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Computer program for radial distribution analysis of X-ray, neutron and electron diffraction data
P. D'Antonio
and
J. H. Konnert
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J. Appl. Cryst.
(1979).
12
,
636-638
doi: 10.1107/S0021889879013546
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A system for interactive electron image calculations
A. J. Skarnulis
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meeting reports
J. Appl. Cryst.
(1979).
12
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638-639
doi: 10.1107/S0021889879013558
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Inter-Congress Symposium on Accuracy in Powder Diffraction, National Bureau of Standards, Washington DC, USA, 11–15 June 1979
L. D. Calvert
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crystallographers
J. Appl. Cryst.
(1979).
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,
639
doi: 10.1107/S002188987901356X
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1979).
12
,
639-640
doi: 10.1107/S0021889879013571
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Prices of
Acta Crystallographica
and
Journal of Applied Crystallography
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J. Appl. Cryst.
(1979).
12
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640
doi: 10.1107/S0021889879013583
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Report of the Eleventh General Assembly International Congress of Crystallography
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J. Appl. Cryst.
(1979).
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640
doi: 10.1107/S0021889879013595
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Report of Executive Committee for 1978
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J. Appl. Cryst.
(1979).
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640
doi: 10.1107/S0021889879013601
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Commission on Journals: Chemical Nomenclature
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book reviews
J. Appl. Cryst.
(1979).
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640-641
doi: 10.1107/S0021889879013613
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Scanning electron microscopy 1978. Vol. I
edited by O. Johari
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J. Appl. Cryst.
(1979).
12
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641
doi: 10.1107/S0021889879013625
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Surface crystallography by LEED. Theory, computation and structural results
by M. A. Van Hove and S. Y. Tong
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J. Appl. Cryst.
(1979).
12
,
641-642
doi: 10.1107/S0021889879013637
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High pressure science and technology: 6th AIRAPT conference
edited by D. Timmerhaus and M. S. Barker
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J. Appl. Cryst.
(1979).
12
,
642
doi: 10.1107/S0021889879013649
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Crystals: growth, properties and applications. Vol. 1. Crystals for magnetic applications
edited by C. J. M. Rooijmans
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