Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 13| Part 3

ISSN: 1600-5767

June 1980 issue

research papers

Un goniomètre original très précis pour la diffraction des rayons X sur poudre à température controlée

J. F. Bérar, G. Calvarin and D. Weigel

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A high-sensitivity double-beam triple-crystal X-ray spectrometer for lattice parameter and topographic measurements

R. C. Buschert, S. Pace, D. Inzaghi and A. E. Merlini

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The morphotropic phase boundary in PZT solid solutions

S. A. Mabud

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Ferroelastic phase transition in BiVO₄ I. Birefringence measurements using the rotating-analyser method

I. G. Wood and A. M. Glazer

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Ferroelastic phase transition in BiVO₄ II. Birefringence at simultaneous high pressure and temperature

I. G. Wood, B. Welber, W. I. F. David and A. M. Glazer

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A measurement method of growth and dissolution rates of birefringent crystal faces

M. Rubbo

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Exact solution of the slit-height correction problem in small-angle X-ray scattering. III. Derivation of slit correction functions

M. Luban and M. Deutsch

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Optical transforms of disordered molecular crystals

T. R. Welberry and R. D. G. Jones

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The asymmetrically cut Bonse–Hart X-ray diffractometer. I. Design principles and performance

M. Deutsch

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The asymmetrically cut Bonse–Hart X-ray diffractometer. II. Comparison with the Kratky camera

M. Deutsch

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A new small-angle neutron scattering (SANS) instrument at ORNL using a position-sensitive area detector

H. R. Child and S. Spooner

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The production of cold and ultracold neutrons by a moving crystal lattice

C. F. Majkrzak and S. S. Malik

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Small-angle X-ray data processing for planar multilayered structures. 2. Experimental determination of the parameters for retinal photoreceptors and sarcoplasmic reticulum membranes

C. R. Worthington, A. R. Worthington and S. K. Wang

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Determination of the largest particle dimension by direct Fourier cosine transformation of experimental small-angle X-ray scattering data

J. J. Müller, P. W. Schmidt, G. Damaschun and G. Walter

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The application of a position-sensitive detector to high-pressure X-ray diffraction using a diamond-anvil cell

Y. Fujii, O. Shimomura, K. Takemura, S. Hoshino and S. Minomura

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Determination of strain concentration by microfluorescent densitometry of X-ray topography: A bridge between microfracture and continuum mechanics

Z. H. Kalman, J. Chaudhuri, G. J. Weng and S. Weissmann

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X-ray studies of growth striations in Fe–2.8 wt%Si alloy single crystals

M. Polcarová, S. Kadečková and P. Vaněk

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short communications

A strategy for collecting isomorphous derivative data with the oscillation method

A. G. W. Leslie and T. Tsukihara

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Revidierte Kristalldaten für Kaliumhexachlorotellurat, K₂TeCl₆

H. Henke

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Crystal data and structural relation between Pb₆GeO₈.Pb₁₁Ge₃O₁₇ and PbO

H. H. Otto

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Unit-cell dimensions and space group of cholesteryl ethyl carbonate

N. C. Shivaprakash, P. K. Rajalakshmi and J. Shashidhara Prasad

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Crystal data for AgGa_xIn_1−xSe₂ and CuGa_xIn_1−xSe₂

B. Gržeta-Plenković, S. Popović, B. Čelustka and B. Šantić

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Crystal data for bis(1,10-phenanthroline)–hydrochloric acid dihydrate, (C₁₂H₈N₂)₂.HCl.2H₂O

G. Thevenet, C. Souleau, M. Montagu-Bourin and R. Ceolin

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computer programs

Average of equivalent reflections using small computers

J. Rigoult and C. Guidi-Morosini

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international union of crystallography

Commission on Crystallographic Apparatus. Microdensitometer Project report I. Inter-Experimental Agreement

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laboratory notes

Lengthening the focal spot in Elliot rotating-anode X-ray sets

W. C. Phillips

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Longer filament lifetimes for rotating-anode X-ray machines using a beam-deflecting magnet

W. C. Phillips

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A device for powder-film calibration

G. Donnay and M. H. Knoepfel

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A method of calibrating powder-camera films

M. Cartwright

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meeting reports

Symposium on Crystallographic Studies Using Energy-Dispersive Diffraction, American Crystallographic Association, Boston University, Boston, Massachusetts, USA, 12–17 August 1979

C. T. Prewitt and D. E. Cox

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crystallographers

Crystallographers

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international union of crystallography

President's Fund

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book reviews

Nondestructive evaluation of semiconductor materials and devices by J. N. Zemel

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