Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 14
|
Part 2
ISSN: 1600-5767
April 1981 issue
research papers
J. Appl. Cryst.
(1981).
14
,
79-81
doi: 10.1107/S0021889881008832
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Computer simulation of electron microscope images on microfiche
K. M. Crennell
and
L. G. Mallinson
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J. Appl. Cryst.
(1981).
14
,
82-84
doi: 10.1107/S0021889881008844
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A low-temperature Weissenberg camera for neutrons
D. Hohlwein
and
A. F. Wright
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J. Appl. Cryst.
(1981).
14
,
85-93
doi: 10.1107/S0021889881008856
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Characteristics of a flat multiwire area detector for protein crystallography
R. Hamlin
,
C. Cork
,
A. Howard
,
C. Nielsen
,
W. Vernon
,
D. Matthews
and
Ng. H. Xuong
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J. Appl. Cryst.
(1981).
14
,
94-100
doi: 10.1107/S0021889881008868
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A computer graphics system for the building of macromolecular models into electron density maps
J. R. Miller
,
S. S. Abdel-Meguid
,
M. G. Rossmann
and
D. C. Anderson
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J. Appl. Cryst.
(1981).
14
,
101-108
doi: 10.1107/S002188988100887X
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Convolution square root of band-limited symmetrical functions and its application to small-angle scattering data
O. Glatter
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J. Appl. Cryst.
(1981).
14
,
109-116
doi: 10.1107/S0021889881008881
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Theoretical scattering amplitudes for the atomic scattering of low-energy electrons for use in surface crystallography by low-energy electron diffraction
G. B. Olszewski
and
S. L. Bernasek
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J. Appl. Cryst.
(1981).
14
,
117-123
doi: 10.1107/S0021889881008893
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The use of cell and symmetry information for single-crystal orientation on diffractometers
Y. Le Page
and
E. J. Gabe
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J. Appl. Cryst.
(1981).
14
,
124-130
doi: 10.1107/S002188988100890X
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An assessment of instrumental parameters which control the accuracy of stress measurement using the X-ray diffractometer method
P. Doig
,
D. Lonsdale
and
P. E. J. Flewitt
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J. Appl. Cryst.
(1981).
14
,
131-133
doi: 10.1107/S0021889881008911
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Lattice-parameter studies on V
0.977
Mo
0.023
O
2
the vicinity of the semiconductor-to-metal transition
D. Kucharczyk
and
T. Niklewski
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J. Appl. Cryst.
(1981).
14
,
134-136
doi: 10.1107/S0021889881008923
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Rotation data collection for protein crystallography with time-variable incident intensity from synchrotron radiation sources
H. D. Bartunik
,
P. N. Clout
and
B. Robrahn
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short communications
J. Appl. Cryst.
(1981).
14
,
137-139
doi: 10.1107/S0021889881008935
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Neutron powder diffraction of forsterite, Mg
2
SiO
4
: a comparison with single-crystal investigations
G. A. Lager
,
F. K. Ross
,
F. J. Rotella
and
J. D. Jorgensen
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J. Appl. Cryst.
(1981).
14
,
139-141
doi: 10.1107/S0021889881008947
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Adaptation of a Kratky camera to use with a one-dimensional position-sensitive detector
R.-J. Roe
,
J. C. Chang
,
M. Fishkis
and
J. J. Curro
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crystal data
J. Appl. Cryst.
(1981).
14
,
141-142
doi: 10.1107/S0021889881008959
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Crystal data for β-PbO
2
H. Harada
,
Y. Sasa
and
M. Uda
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J. Appl. Cryst.
(1981).
14
,
143-144
doi: 10.1107/S0021889881008960
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Données cristallographiques sur l'aquapentachlororhodate d'ammonium (NH
4
)
2
[RhCl
5
(H
2
O)]
G. Bugli
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J. Appl. Cryst.
(1981).
14
,
145
doi: 10.1107/S0021889881008972
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Crystal data for 5-hydroxy-7-methyl-1,4-naphthoquinone
A. Hussain
,
M. R. Hussain
and
S. Mehdi
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computer programs
J. Appl. Cryst.
(1981).
14
,
145-148
doi: 10.1107/S0021889881008984
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XPKFIT
: peak separation with arbitrary relations among the component peaks
M. Hayakawa
and
M. Oka
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J. Appl. Cryst.
(1981).
14
,
149-151
doi: 10.1107/S0021889881008996
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A new computer program for Rietveld analysis of X-ray powder diffraction patterns
D. B. Wiles
and
R. A. Young
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J. Appl. Cryst.
(1981).
14
,
151-153
doi: 10.1107/S002188988100900X
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BLOKJE
, a computer program to calculate the domain of an atom in a structure
L. Gelato
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laboratory notes
J. Appl. Cryst.
(1981).
14
,
153-154
doi: 10.1107/S0021889881009011
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A simple method for surveying macromolecular crystallization conditions by microdialysis
I. Rayment
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J. Appl. Cryst.
(1981).
14
,
154-155
doi: 10.1107/S0021889881009023
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Determination of Bragg peaks from a flat single crystal using a rotation photograph
H. Chen
and
M. A. Dvorack
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crystallographers
J. Appl. Cryst.
(1981).
14
,
155
doi: 10.1107/S0021889881009035
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Free
Crystallographers
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book reviews
J. Appl. Cryst.
(1981).
14
,
155-156
doi: 10.1107/S0021889881009047
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Free
Crystal growth: a tutorial approach
edited by W. Bardsley, D. T. J. Hurle and J. B. Mullin
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