Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 15
|
Part 5
ISSN: 1600-5767
October 1982 issue
research papers
J. Appl. Cryst.
(1982).
15
,
471-475
doi: 10.1107/S0021889882012448
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X-ray powder diffraction of β-aluminas
V. Massarotti
,
G. Campari-Vigano
,
G. Flor
,
A. Marini
,
G. C. Farrington
and
M. Villa
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J. Appl. Cryst.
(1982).
15
,
476-481
doi: 10.1107/S002188988201245X
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The three-dimensional structure of a human IgGl immunoglobulin at 4 Å resolution: a computer fit of various structural domains on the electron density map
R. Sarma
and
A. G. Laudin
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J. Appl. Cryst.
(1982).
15
,
482-487
doi: 10.1107/S0021889882012461
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X-ray diffraction study of aqueous SrCl
2
solutions
R. Caminiti
,
A. Musinu
,
G. Paschina
and
G. Pinna
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J. Appl. Cryst.
(1982).
15
,
488-492
doi: 10.1107/S0021889882012473
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Polymorphism in silver thiocyanate: preparation of a new phase and its chaacterization by X-ray powder diffraction
D. L. Smith
,
J. E. Maskasky
and
L. R. Spaulding
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J. Appl. Cryst.
(1982).
15
,
493-508
doi: 10.1107/S0021889882012485
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Oscillation camera data processing: reflecting range and prediction of partiality. 2. Monochromatized synchrotron X-radiation from a singly bent triangular monochromator
T. J. Greenhough
and
J. R. Helliwell
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J. Appl. Cryst.
(1982).
15
,
509-512
doi: 10.1107/S0021889882012497
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Recording and calculation of
hk
rod intensities in case of diffraction by highly oriented powders of lamellar samples
A. Plançon
,
F. Rousseaux
,
D. Tchoubar
,
C. Tchoubar
,
G. Krinari
and
V. A. Drits
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J. Appl. Cryst.
(1982).
15
,
513-523
doi: 10.1107/S0021889882012503
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A new minicomputer search/match/identify program for qualitative phase analysis with the powder diffractometer
W. N. Schreiner
,
C. Surdukowski
and
R. Jenkins
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J. Appl. Cryst.
(1982).
15
,
524-530
doi: 10.1107/S0021889882012515
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A probability-based socring technique for phase identification in X-ray powder diffraction
W. N. Schreiner
,
C. Surdukowski
and
R. Jenkins
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J. Appl. Cryst.
(1982).
15
,
531-536
doi: 10.1107/S0021889882012527
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A test for the computer-aided generation of the Cambridge Connectivity Files
T. Higashi
and
K. Osaki
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J. Appl. Cryst.
(1982).
15
,
537-539
doi: 10.1107/S0021889882012539
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A computer program for refinement of crystal orientation matrix and lattice constants from diffractometer data with lattice symmetry constraints
R. L. Ralph
and
L. W. Finger
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J. Appl. Cryst.
(1982).
15
,
540-541
doi: 10.1107/S0021889882012540
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Non-centrosymmetry tests for potassium feldspars: an application of the second-harmonic generator technique
J. A. Zilczer
and
G. M. Loiacono
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J. Appl. Cryst.
(1982).
15
,
542-545
doi: 10.1107/S0021889882012552
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Indexation automatique des diagrammes de poudre par dichotomies successives
D. Louër
and
R. Vargas
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J. Appl. Cryst.
(1982).
15
,
546-557
doi: 10.1107/S0021889882012564
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The use of continuous diffraction data as a phase constraint. II. Application to fiber diffraction data
L. Makowski
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J. Appl. Cryst.
(1982).
15
,
558-563
doi: 10.1107/S0021889882012576
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Microdeformation of [111] iron whiskers
M. Surowiec
and
G. Champier
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J. Appl. Cryst.
(1982).
15
,
564-566
doi: 10.1107/S0021889882012588
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Aggregation of clay particles as indicated by indirect transforms of small-angle scattering data
C. W. Dwiggins Jnr
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J. Appl. Cryst.
(1982).
15
,
567-569
doi: 10.1107/S002188988201259X
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Interpretation of small-angle scattering curves proportional to a negative power of the scattering vector
P. W. Schmidt
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short communications
J. Appl. Cryst.
(1982).
15
,
570-571
doi: 10.1107/S0021889882012606
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A novel method for indexing multiple diffraction peaks
F.-S. Han
and
S.-L. Chang
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J. Appl. Cryst.
(1982).
15
,
571-573
doi: 10.1107/S0021889882012618
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A method to increase protein-crystal lifetime during X-ray exposure
S. V. L. Narayana
,
M. S. Weininger
,
K. L. Heuss
and
P. Argos
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crystal data
J. Appl. Cryst.
(1982).
15
,
573-574
doi: 10.1107/S002188988201262X
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Crystal chemical data on RbLn(SeO
4
)
2
, where Ln=La, Ce, Pr or Nd
M. A. Nabar
and
V. R. Ajgaonkar
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J. Appl. Cryst.
(1982).
15
,
574-576
doi: 10.1107/S0021889882012631
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Crystal data for the fluoroalleghanyite series
n
Mn
2
SiO
4
MnF
2
(1,
n
<4)
T. J. White
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laboratory notes
J. Appl. Cryst.
(1982).
15
,
577
doi: 10.1107/S0021889882012643
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A systematic method for aligning double-focusing mirrors
W. C. Phillips
and
I. Rayment
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crystallographers
J. Appl. Cryst.
(1982).
15
,
577
doi: 10.1107/S0021889882012655
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Crystallographers
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notes and news
J. Appl. Cryst.
(1982).
15
,
577-578
doi: 10.1107/S0021889882012667
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book reviews
J. Appl. Cryst.
(1982).
15
,
578
doi: 10.1107/S0021889882012679
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Diffraction for materials scientists
by J. M. Schulz
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J. Appl. Cryst.
(1982).
15
,
579
doi: 10.1107/S0021889882012680
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Mössbauer spectroscopy and its chemical applications
edited by J. G. Stevens and G. K. Shenoy
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J. Appl. Cryst.
(1982).
15
,
579
doi: 10.1107/S0021889882012692
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Chemical vapor deposition 1960-1980, a bibliography
edited by D. T. Hawkins
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J. Appl. Cryst.
(1982).
15
,
579-580
doi: 10.1107/S0021889882012709
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Neutron transmutation doped silicon
edited by J. Guldberg
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books received
J. Appl. Cryst.
(1982).
15
,
580
doi: 10.1107/S0021889882012710
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Japan Annual Reviews in Electronics, Computers and Telecommunications
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