Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 16| Part 2

ISSN: 1600-5767

April 1983 issue

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research papers

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The estimation of standard deviations in powder diffraction Rietveld refinements

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The structure of Na₂UCl₆ and Li₂UCl₆ from multiphase powder neutron profile refinement

P. J. Bendall, A. N. Fitch and B. E. F. Fender

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Microdiffraction from stacking faults and twin boundaries in F.c.c. crystals

J. Zhu and J. M. Cowley

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A method for the interpretation of the Warren–Averbach mean-squared strains and its application to recovery in aluminium

M. J. Turunen, Th. de Keijser, R. Delhez and N. M. van. der. Pers

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A precise determination of the shape, size and distribution of size of crystallites in zinc oxide by X-ray line-broadening analysis

D. Louër, J. P. Auffrédic, J. I. Langford, D. Ciosmak and J. C. Niepce

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Routine recording of diffuse scattering from disordered molecular crystals

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A focusing X-ray camera for recording low-angle diffraction from small specimens

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A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. I. Principles and construction

J. Kobayashi and Y. Uesu

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A new optical method and apparatus `HAUP' for measuring simultaneously optical activity and birefringence of crystals. II. Application to triglycine–sulphuric acid (NH₂CH₂CO₂H)₃.H₂SO₄

J. Kobayashi, Y. Uesu and H. Takehara

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An energy-dispersive spectrometer for the rapid measurement of X-ray absorption spectra using synchrotron radiation

R. P. Phizackerley, Z. U. Rek, G. B. Stephenson, S. D. Conradson, K. O. Hodgson, T. Matsushita and H. Oyanagi

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Double hexagonal superstructure of Au–Mg alloy containing 20 at.% Mg studied by high-voltage high-resolution electron microscopy

D. Shindo, K. Haraga, M. Hirabayashi, O. Terasaki and D. Watanabe

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X-ray guide tube for diffraction experiments

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Oscillation camera data processing. 3. General diffraction spot size, shape and energy profile: formalism for polychromatic diffraction experiments with monochromatized synchrotron X-radiation from a singly bent triangular monochromator

T. J. Greenhough, J. R. Helliwell and S. A. Rule

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X-ray measurement of the static Debye–Waller factor of NbH_x

H. Behr, H. Metzger and J. Peisl

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Reciprocal-lattice-compatible representation of linear position-sensitive detector output

A. McL Mathieson

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Difference thermal analysis of crystalline solids by the use of energy-dispersive X-ray diffraction

N. Eisenreich and W. Engel

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X-ray diffraction studies on the arrangement of water molecules in a smectite. I.Homogeneous two-water-layer Na-beidellite

J. B. Brahim, N. Armaǧan, G. Besson and C. Tchoubar

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A rapid and precise method of measuring Kendrew-model coordinates with theodolites

L. Lebioda, M. H. Hatada and A. Tulinsky

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short communications

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The determination of the crystallinity in glass-ceramic materials by the method of Ruland

C. G. Vonk and G. Fagherazzi

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crystal data

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Crystal data for 2-(4-methyl-2-pyridyliminomethyl)phenol and 2-(4,6-dimethyl-2-pyridyliminomethyl)phenol

C. Escobar, M. T. Garland and E. Spodine

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Crystal data for bis(η⁵-tert-butylcyclopentadienyl)hafnium(IV) dihydride dimer, [(η⁵-t-BuC₅H₄)₂HfH(μ-H)]₂

A. Laarif, F. Theobald, B. Gautheron and G. Tainturier

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Kristallstrukturdaten von PdPb_0.2As_0.8(m)

M. Ellner, U. Kattner and B. Predel

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Crystal data for nickel and cadmium α-L-alaninates

A. Démaret and D. Mercier

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computer programs

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An interactive program for the interpretation and simulation of Laue patterns

J. Laughier and A. Filhol

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crystallographers

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Crystallographers

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international union of crystallography

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International Tables for Crystallography

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