Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 18
|
Part 4
ISSN: 1600-5767
August 1985 issue
research papers
J. Appl. Cryst.
(1985).
18
,
191-196
doi: 10.1107/S0021889885010147
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Calculation of intensity distribution in the case of oblique texture electron diffraction
A. Plançon
,
S. I. Tsipurski
and
V. A. Drits
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J. Appl. Cryst.
(1985).
18
,
197-204
doi: 10.1107/S0021889885010159
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Electron optical study of rutile
R. C. Creek
and
A. E. C. Spargo
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J. Appl. Cryst.
(1985).
18
,
205-213
doi: 10.1107/S0021889885010160
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Particle size distribution from small-angle X-ray scattering data
G. Walter
,
R. Kranold
,
T. Gerber
,
J. Baldrian
and
M. Steinhart
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J. Appl. Cryst.
(1985).
18
,
214-218
doi: 10.1107/S0021889885010172
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LASIP
: a liquid and amorphous structure investigation package
P. Lecante
,
A. Mosset
and
J. Galy
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J. Appl. Cryst.
(1985).
18
,
219-229
doi: 10.1107/S0021889885010184
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Parameterizations of scattering intensities and values of the angularities and of the interphase surfaces for three-component amorphous samples
S. Ciccariello
and
A. Benedetti
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J. Appl. Cryst.
(1985).
18
,
230-236
doi: 10.1107/S0021889885010196
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A comparison of the merits of isotopic substitution in neutron small-angle scattering and anomalous X-ray scattering for the evaluation of partial structure functions in a ternary alloy
J. P. Simon
,
O. Lyon
and
D. de Fontaine
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J. Appl. Cryst.
(1985).
18
,
237-240
doi: 10.1107/S0021889885010202
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The structural chirality and optical activity of α-LiIO
3
K. Stadnicka
,
A. M. Glazer
and
J. R. L. Moxon
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J. Appl. Cryst.
(1985).
18
,
241-247
doi: 10.1107/S0021889885010214
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The model resolution function – a technique for estimating the quality of approximation of particles by models in small-angle X-ray or neutron scattering
J. J. Müller
,
G. Damaschun
and
P. W. Schmidt
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J. Appl. Cryst.
(1985).
18
,
248-252
doi: 10.1107/S0021889885010226
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Lissage d'un profil de raie de diffraction pour analyse de Fourier
B. Bourniquel
and
J. Feron
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J. Appl. Cryst.
(1985).
18
,
253-257
doi: 10.1107/S0021889885010238
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Some geometrical problems related to the rotation camera. I. X-ray diffraction pattern generation
D. Taupin
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computer programs
J. Appl. Cryst.
(1985).
18
,
258-262
doi: 10.1107/S002188988501024X
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STRUPLO
84, a Fortran plot program for crystal structure illustrations in polyhedral representation
R. X. Fischer
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computer program abstracts
J. Appl. Cryst.
(1985).
18
,
263
doi: 10.1107/S0021889885010251
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XTAL
: a program system for crystallographic calculations
J. M. Stewart
and
S. R. Hall
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J. Appl. Cryst.
(1985).
18
,
263-264
doi: 10.1107/S0021889885010263
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GENEV
,
GENSIN
,
GENTAN
: phase determination within the
XTAL
system
S. R. Hall
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crystallographers
J. Appl. Cryst.
(1985).
18
,
264
doi: 10.1107/S0021889885010275
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Free
Crystallographers
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book reviews
J. Appl. Cryst.
(1985).
18
,
264-265
doi: 10.1107/S0021889885010287
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Industrial crystallization
edited by Grootscholten Jančić P. A. M.
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J. Appl. Cryst.
(1985).
18
,
265
doi: 10.1107/S0021889885010299
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Industrial crystallization 84
edited by S. J. Jančić and E. J. de Jong
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J. Appl. Cryst.
(1985).
18
,
265-266
doi: 10.1107/S0021889885010305
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Current topics in materials sceince. Vol. 10
edited by E. Kaldis
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