Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 21
|
Part 1
ISSN: 1600-5767
February 1988 issue
research papers
J. Appl. Cryst.
(1988).
21
,
1-4
doi: 10.1107/S0021889887008148
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Four-circle angle calculations for surface diffraction
S. G. J. Mochrie
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J. Appl. Cryst.
(1988).
21
,
4-10
doi: 10.1107/S0021889887008173
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A fixture for X-ray crystallographic studies of biomolecules under high gas pressure
R. F. Tilton Jnr
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J. Appl. Cryst.
(1988).
21
,
10-15
doi: 10.1107/S0021889887008185
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The tensor of compositional deformation. A new crystallographic way to analyse syncrystallization
N. B. Chanh
,
J. Clastre
,
J. Gaultier
,
Y. Haget
,
A. Meresse
,
J. Lajzerowicz
,
A. Filhol
and
M. Thomas
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J. Appl. Cryst.
(1988).
21
,
15-22
doi: 10.1107/S0021889887008239
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X-ray absorption spectroscopy in the dispersive mode with synchrotron radiation: optical considerations
H. Tolentino
,
E. Dartyge
,
A. Fontaine
and
G. Tourillon
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J. Appl. Cryst.
(1988).
21
,
22-28
doi: 10.1107/S0021889887008331
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Simultaneous structure refinement of neutron, synchrotron and X-ray powder diffraction patterns
J. K. Maichle
,
J. Ihringer
and
W. Prandl
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J. Appl. Cryst.
(1988).
21
,
28-33
doi: 10.1107/S0021889887008343
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A position-sensitive detector for neutron diffraction topography
J. Baruchel
,
K. Kuroda
,
P. Liaud
,
A. Michalowicz
and
D. Sillou
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J. Appl. Cryst.
(1988).
21
,
33-38
doi: 10.1107/S0021889887008653
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A new version of a medium-resolution double-crystal diffractometer for the study of small-angle neutron scattering (SANS)
P. Mikula
,
P. Lukáš
and
F. Eichhorn
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J. Appl. Cryst.
(1988).
21
,
38-41
doi: 10.1107/S0021889887008860
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The effect of sample position on the determination of triaxial stress by X-ray diffraction
R. H. Fenn
and
A. M. Jones
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J. Appl. Cryst.
(1988).
21
,
41-47
doi: 10.1107/S0021889887008975
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X-ray determination of static displacements of atoms in alloyed Ni
3
Al
M. Morinaga
,
K. Sone
,
T. Kamimura
,
K. Ohtaka
and
N. Yukawa
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J. Appl. Cryst.
(1988).
21
,
47-54
doi: 10.1107/S0021889887009178
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Asymmetric X-ray line broadening of plastically deformed crystals. I. Theory
I. Groma
,
T. Ungár
and
M. Wilkens
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J. Appl. Cryst.
(1988).
21
,
54-59
doi: 10.1107/S0021889887009579
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Mirror and Bragg reflections of neutrons at a nuclear resonance
C. M. Batigun
and
R. M. Brugger
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J. Appl. Cryst.
(1988).
21
,
59-66
doi: 10.1107/S0021889887009580
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X-ray diffraction line broadening due to dislocations in non-cubic materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystals
P. Klimanek
and
R. Kužel Jnr
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J. Appl. Cryst.
(1988).
21
,
67-72
doi: 10.1107/S0021889887009737
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Automatic indexing of rotation diffraction patterns
W. Kabsch
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short communications
J. Appl. Cryst.
(1988).
21
,
72-74
doi: 10.1107/S0021889887008197
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Evidence of a single-
q
incommensurate phase in quartz by synchrotron X-ray diffraction
A. Zarka
,
B. Capelle
,
M. Petit
,
G. Dolino
,
P. Bastie
and
B. Berge
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crystal data
J. Appl. Cryst.
(1988).
21
,
74-75
doi: 10.1107/S0021889887010070
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New crystal data (neutron) for phase II rubidium nitrate at 513 K
M. Shamsuzzoha
and
B. W. Lucas
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computer program abstracts
J. Appl. Cryst.
(1988).
21
,
75
doi: 10.1107/S0021889887008665
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MOLDRAW
- program for the graphical manipulation of molecules on personal computers
P. Ugliengo
,
G. Borzani
and
D. Viterbo
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crystallographers
J. Appl. Cryst.
(1988).
21
,
75-76
doi: 10.1107/S0021889887011671
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Free
Crystallographers
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notes and news
J. Appl. Cryst.
(1988).
21
,
76
doi: 10.1107/S0021889888099777
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Free
Publish your Crystallographic Computer Programs
Read article
new commercial products
J. Appl. Cryst.
(1988).
21
,
76-78
doi: 10.1107/S0021889888099765
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New Commercial Products
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