Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 21| Part 3

ISSN: 1600-5767

June 1988 issue

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research papers

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The three-dimensional dynamic DuMond diagram for X-ray diffraction analysis of nearly perfect crystals

S. Xu and R. Li

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Analysis of single- and double-crystal spectrometers using three-dimensional DuMond diagrams and the high-precision measurement of the Cu Kα₁ line profile

S. Xu, J. Chen and R. Li

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Determination of crystal structures with large known fragments directly from measured X-ray powder diffraction intensities

J. Rius and C. Miravitlles

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Profile fitting and the two-stage method in neutron powder diffractometry for structure and texture analysis

E. Jansen, W. Schäfer and G. Will

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Investigation of (Ga,In)(As,P)/InP single heterostructures by means of extremely asymmetrical Bragg diffraction using synchrotron radiation

H.-G. Brühl, U. Pietsch and B. Lengeler

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Precise relative X-ray measurement of the lattice parameter of silicon crystals with growth striations

J. Kuběna and V. Holý

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High-resolution X-ray diffraction studies of multilayers

F. E. Christensen, A. Hornstrup and H. W. Schnopper

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Interpretation of bent-crystal rocking curves

M. Popovici, A. D. Stoica, B. Chalupa and P. Mikula

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Time-resolved powder diffraction as an analytical tool for diffusion studies in microporous topologies

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short communications

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A novel method of mounting a protein crystal on a surface perpendicular to the X-ray capillary

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computer programs

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MERLOT, an integrated package of computer programs for the determination of crystal structures by molecular replacement

P. M. D. Fitzgerald

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Calculation of an OMIT map

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laboratory notes

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A backlash-free high-precision rotation stage based on flexure strips

R. Cathie and S. Janky

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computer program abstracts

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ENDIX – a program to simulate energy-dispersive X-ray powder diffraction diagrams

E. Hovestreydt, E. Parthé and U. Benedict

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crystallographers

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Crystallographers

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