Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 22
|
Part 1
ISSN: 1600-5767
February 1989 issue
research papers
J. Appl. Cryst.
(1989).
22
,
1-8
doi: 10.1107/S0021889888009550
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Testing the method of crystallographic refinement using molecular dynamics
M. Fujinaga
,
P. Gros
and
W. F. van Gunsteren
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J. Appl. Cryst.
(1989).
22
,
9-18
doi: 10.1107/S0021889888009562
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The processing of diffraction data taken on a screenless Weissenberg camera for macromolecular crystallography
T. Higashi
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J. Appl. Cryst.
(1989).
22
,
19-22
doi: 10.1107/S0021889888009057
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Some computer drawings of molecular and solid-state structures
E. Keller
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J. Appl. Cryst.
(1989).
22
,
23-25
doi: 10.1107/S0021889888009574
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Critical temperatures of superconductivity and neutron diffraction studies at 293 and at 10 K of molybdenum–iridium single crystals of A15 structure
R. Koksbang
,
S. E. Rasmussen
and
R. G. Hazell
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J. Appl. Cryst.
(1989).
22
,
26-34
doi: 10.1107/S0021889888009720
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Asymmetric X-ray line broadening of plastically deformed crystals. II. Evaluation procedure and application to [001]-Cu crystals
T. Ungár
,
I. Groma
and
M. Wilkens
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J. Appl. Cryst.
(1989).
22
,
35-41
doi: 10.1107/S0021889888010003
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Discrete thin-film multilayer design for X-ray and neutron supermirrors
J. B. Hayter
and
H. A. Mook
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J. Appl. Cryst.
(1989).
22
,
42-45
doi: 10.1107/S002188988801060X
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An X-ray diffractometer for studying the effect of external fields on the structure and electron distribution of single crystals
L. A. Aslanov
,
V. A. Trunov
,
G. V. Fetisov
,
V. A. Priemyshev
,
V. B. Rybakov
,
Ya. A. Kasman
and
A. P. Bulkin
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J. Appl. Cryst.
(1989).
22
,
46-52
doi: 10.1107/S0021889888010817
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Mass attenuation coefficients of the elements Ti, V, Fe, Co, Ni, Cu and Zn for the
K
emission lines between 4.51 and 10.98 keV
L. Unonius
and
P. Suortti
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J. Appl. Cryst.
(1989).
22
,
53-60
doi: 10.1107/S0021889888010878
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Auto-indexing oscillation photographs
S. Kim
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J. Appl. Cryst.
(1989).
22
,
61-63
doi: 10.1107/S002188988801091X
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Crystal structure and the equation of state of thorium monophosphide for pressures up to 50 GPa
J. S. Olsen
,
L. Gerward
,
U. Benedict
,
H. Luo
and
O. Vogt
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J. Appl. Cryst.
(1989).
22
,
64-69
doi: 10.1107/S0021889888011392
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A high-resolution multiple-crystal multiple-reflection diffractometer
P. F. Fewster
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short communications
J. Appl. Cryst.
(1989).
22
,
70
doi: 10.1107/S002188988801386X
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Synchrotron X-ray and neutron powder diffraction studies of the structure of α-CrPO
4
. Erratum
J. P. Attfield
,
A. K. Cheetham
,
D. E. Cox
and
A. W. Sleight
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J. Appl. Cryst.
(1989).
22
,
70
doi: 10.1107/S0021889888013871
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Developments in the
MITHRIL
direct methods program. Erratum
C. J. Gilmore
and
S. R. Brown
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J. Appl. Cryst.
(1989).
22
,
70-72
doi: 10.1107/S0021889888009847
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A multiple-slit collimator for synchrotron white-beam section topography
S. R. Stock
,
Y. H. Chung
and
Z. U. Rek
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J. Appl. Cryst.
(1989).
22
,
72-74
doi: 10.1107/S0021889888009963
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Rapid small-angle X-ray diffraction of a tonically contracting molluscan smooth muscle recorded with imaging plates
Y. Tajima
,
K. Okada
,
O. Yoshida
,
T. Seto
and
Y. Amemiya
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laboratory notes
J. Appl. Cryst.
(1989).
22
,
75
doi: 10.1107/S0021889888009872
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L'octadécanol-1: un composé étalon en diffraction aux petits angles
N. Nakamura
,
G. Gebel
and
P. Aldebert
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J. Appl. Cryst.
(1989).
22
,
75
doi: 10.1107/S0021889888011173
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Controlling the Philips PW1100 diffractometer by an IBM-compatible personal computer
G. J. van Hummel
and
H. Graafsma
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J. Appl. Cryst.
(1989).
22
,
76
doi: 10.1107/S0021889888011835
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A three-dimensional space-group model
C. H. L. Kennard
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crystallographers
J. Appl. Cryst.
(1989).
22
,
76-77
doi: 10.1107/S0021889888012099
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Crystallographers
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international union of crystallography
J. Appl. Cryst.
(1989).
22
,
77
doi: 10.1107/S0021889889099838
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Report on the IUCr Logo Design Contest
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notes and news
J. Appl. Cryst.
(1989).
22
,
77-78
doi: 10.1107/S0021889888013883
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European Microbeam Analysis Society
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new commercial products
J. Appl. Cryst.
(1989).
22
,
78
doi: 10.1107/S0021889889099826
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