Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 24| Part 6

ISSN: 1600-5767

December 1991 issue

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obituaries

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William Parrish, 1915-1991

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research papers

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Some practical features for calculating the polycrystalline elastic properties from texture

M. Humbert and J. Diz

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Complete determination of polarization state in the hard X-ray region

T. Ishikawa, K. Hirano and S. Kikuta

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Indexing of powder diffraction patterns for low-symmetry lattices by the successive dichotomy method

A. Boultif and D. Louër

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Solving the problem of SANS instrument optimization

F. M. A. Margaça, A. N. Falcão, J. F. Salgado and F. G. Carvalho

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Angle-sensitive X-ray topographs obtained with Kossel lines

D. B. Wittry, S. Sun and W. Z. Chang

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Crystal structure determination by neutron powder diffraction using structural and packing constraints

P. G. Byrom and B. W. Lucas

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The application of the neutron time-of-flight technique for real-time diffraction studies

A. M. Balagurov, G. M. Mironova, V. E. Novozchilov, A. I. Ostrovnoy, V. G. Simkin and V. B. Zlokazov

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X-ray diffraction study of lithium hydrazinium sulfate and lithium ammonium sulfate crystals under a static electric field

M. T. Sebastian, R. A. Becker and H. Klapper

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Structures of Zr₂Co₁₁ and HfCo₇ intermetallic compounds

B. G. Demczyk and S. F. Cheng

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The nature of the scattering tail in Cu–Ni–Fe and Invar alloys investigated by anomalous small-angle X-ray scattering

J. P. Simon and O. Lyon

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The evaluation of transmission factors and their first derivatives with respect to crystal shape parameters

E. Blanc, D. Schwarzenbach and H. D. Flack

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High-energy resolution in X-ray scattering with the spectrometer INELAX. I. The principles and the test instrument

E. Burkel, B. Dorner, Th. Illini and J. Peisl

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The determination of crystal size and disorder from the X-ray diffraction photograph of polymer fibres. 2. Modelling intensity profiles

I. H. Hall and R. Somashekar

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short communications

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A microprocessor-controlled multichannel analyser for wavelength determination

J. Lange and H. Burzlaff

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The effect of temperature on the fine structural characteristics of cotton-fibre – a small-angle X-ray scattering investigation using correlation functions. Erratum

T. Misra, D. K. Bisoyi, Md. N. Khan and T. Patel

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computer programs

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AUTOMR: an automatic processing program system for the molecular replacement method

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32 bit personal computer version of the DIRECT-SEARCHER system

K. Okada and H. Koyama

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Automatic searching of an asymmetric unit from the space-group symbol

G. Cascarano, C. Giacovazzo and R. Spagna

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laboratory notes

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Modified counterweights and beamstop for the Huber 512 and 511.1 four-circle diffractometers

H. Graafsma, G. Sagerman and P. Coppens

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A method of equilibrating protein crystals with heavy-atom reagents

P. R. David and S. K. Burley

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A simple device for mounting a vacuum chamber on a four-circle diffractometer with central χ circle

N. Toyoshima, H. Hoya and K.-I. Ohshima

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fast communications

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Converse-transformation analysis

V. L. Karen and A. D. Mighell

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computer program abstracts

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FRDICT – ab initio generation of FRODO dictionary

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meeting reports

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The First European Powder Diffraction Conference. Meeting Report

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crystallographers

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Crystallographers

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international union of crystallography

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Prices of Acta Crystallographica and Journal of Applied Crystallography

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Deadline for application for IUCr sponsorship of meetings

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Sixteenth International Congress of Crystallography, 21-29 August 1993, Beijing, China. Proposals for programme topics and categories

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Notes for Authors - Journal of Applied Crystallography

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