Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 25| Part 3

ISSN: 1600-5767

June 1992 issue

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research papers

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Line shifts in crystal powder diffractometers

M. Popovici and A. D. Stoica

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The application of cluster analysis in X-ray diffraction phase analysis

B. Liao and J. Chen

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An X-ray spectrometer with an energy resolution of 54 meV

W. Hofmann, J. Kalus and U. Schmelzer

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A high-speed data-collection system for large-unit-cell crystals using an imaging plate as a detector

M. Sato, M. Yamamoto, K. Imada, Y. Katsube, N. Tanaka and T. Higashi

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The effect of absorption on the integrated reflectivity of defective single crystals

P. D. Moran and R. J. Matyi

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Simulation of Renninger scans for heteroepitaxic layers

C. A. B. Salles da Costa, L. P. Cardoso, V. L. Mazzocchi and C. B. R. Parente

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Accurate determination of strain tensors from small shifts of reflections measured on a four-circle diffractometer

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Angular measurements with X-ray interferometry

D. Windisch and P. Becker

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The control of geometrical sources of error in X-ray diffraction applied to stress analysis

F. Convert and B. Miege

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Calculation of diffuse scattering from simulated disordered crystals: a comparison with optical transforms

B. D. Butler and T. R. Welberry

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Caractérisation de la texture de recristallisation primaire et de la spécialité des joints de grains de tôles de Fe-3%Si par diffraction des electrons rétrodiffusés

T. Baudin, P. Paillard and R. Penelle

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On the apparent response of photographic emulsions according to least-squares determinations of the `blackness correction' from gas electron diffraction data

S. Gundersen, T. G. Strand and H. V. Volden

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Quantitive analysis of Laue diffraction patterns recorded with a 120 ps exposure from an X-ray undulator

D. M. E. Szebenyi, D. H. Bilderback, A. LeGrand, K. Moffat, W. Schildkamp, B. Smith Temple and T. Teng

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Precise X-ray relative measurement of lattice parameters of silicon wafers by multiple-crystal Bragg-case diffractometry. Computer simulation of the experiment

F. Cembali, R. Fabbri, M. Servidori, A. Zani, G. Basile, G. Cavagnero, A. Bergamin and G. Zosi

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Bent-crystal monochromator for 150 keV synchrotron radiation

P. Suortti, D. Chapman, J. R. Schneider and T. Tschentscher

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short communications

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Influence of first-order approximations in the incidence parameter on the simulation of symmetric and asymmetric X-ray rocking curves of heteroepitactic structures. Erratum

M. Servidori, F. Cembali, R. Fabbri and A. Zani

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A Laue diffractometer with δ geometry

J. Lange and H. Burzlaff

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computer programs

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FOURDEM: a program written as an aid to teaching the elements of Fourier synthesis and other crystallographic concepts

T. R. Welberry and K. Owen

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MRIA - a program for a full profile analysis of powder multiphase neutron-diffraction time-of-flight (direct and Fourier) spectra

V. B. Zlokazov and V. V. Chernyshev

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Software and methods for precise X-ray analysis

V. V. Chernyshev, G. V. Fetisov, A. V. Laktionov, V. T. Markov, A. P. Nesterenko and S. G. Zhukov

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DIFRAC, single-crystal diffractometer output-conversion software

H. D. Flack, E. Blanc and D. Schwarzenbach

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LSI - a computer program for simultaneous refinement of material structure and microstructure

L. Lutterotti, P. Scardi and P. Maistrelli

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crystallographers

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Crystallographers

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book reviews

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High-resolution transmission electron microscopy edited by P. Buseck, J. Cowley and L. Eyring

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