Journal of Applied Crystallography
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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 25
|
Part 5
ISSN: 1600-5767
October 1992 issue
research papers
J. Appl. Cryst.
(1992).
25
,
545-548
doi: 10.1107/S0021889892004023
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A flame-heated gas-flow furnace for single-crystal X-ray diffraction
R. C. Peterson
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J. Appl. Cryst.
(1992).
25
,
549-558
doi: 10.1107/S0021889892004035
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Correcting spatial distortions and nonuniform response in area detectors
M. Stanton
,
W. C. Phillips
,
Y. Li
and
K. Kalata
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J. Appl. Cryst.
(1992).
25
,
559-570
doi: 10.1107/S0021889892004084
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Profile fitting of X-ray diffraction lines and Fourier analysis of broadening
D. Balzar
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J. Appl. Cryst.
(1992).
25
,
571-577
doi: 10.1107/S0021889892004102
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Powder diffraction in the range of milliseconds
P. U. Pennartz
,
U. Löchner
,
H. Fuess
and
T. Wroblewski
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J. Appl. Cryst.
(1992).
25
,
578-581
doi: 10.1107/S0021889892004096
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X-ray diffraction investigations of CaF
2
at high pressure
L. Gerward
,
J. S. Olsen
,
S. Steenstrup
,
M. Malinowski
,
S. Åsbrink
and
A. Waskowska
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J. Appl. Cryst.
(1992).
25
,
582-588
doi: 10.1107/S0021889892004412
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Phase analysis of bulk samples using sample-tilting X-ray diffractometry
Q. Cong
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J. Appl. Cryst.
(1992).
25
,
589-610
doi: 10.1107/S0021889892003649
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Open
access
Rietveld refinement round robin. I. Analysis of standard X-ray and neutron data for PbSO
4
R. J. Hill
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J. Appl. Cryst.
(1992).
25
,
611-616
doi: 10.1107/S0021889892004795
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Texture in Rietveld refinement
N. C. Popa
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J. Appl. Cryst.
(1992).
25
,
617-623
doi: 10.1107/S0021889892004801
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Crystal structure determination of lithium diborate hydrate, LiB
2
O
3
(OH).H
2
O, from X-ray powder diffraction data collected with a curved position-sensitive detector
D. Louër
,
M. Louër
and
M. Touboul
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J. Appl. Cryst.
(1992).
25
,
624-627
doi: 10.1107/S0021889892005077
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Determination of texture inhomogeneity in near-surface layers. Experimental verification
J. Bonarski
and
A. Morawiec
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J. Appl. Cryst.
(1992).
25
,
628-631
doi: 10.1107/S0021889892004850
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Measurement of powder diffraction sample absorption coefficients using monochromated radiation and transmission geometry
C. R. Ross II
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J. Appl. Cryst.
(1992).
25
,
632-637
doi: 10.1107/S0021889892005363
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Projection matrices for Niggli-reduced cells
W. A. Paciorek
and
M. Bonin
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J. Appl. Cryst.
(1992).
25
,
638-645
doi: 10.1107/S0021889892005211
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The detective quantum efficiency of CCD and vidicon-based detectors for X-ray crystallographic applications
M. Stanton
,
W. C. Phillips
,
Y. Li
and
K. Kalata
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short communications
J. Appl. Cryst.
(1992).
25
,
646-647
doi: 10.1107/S0021889892004813
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Background correction of the SAXS intensities scattered by semicrystalline materials
C. Meng
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J. Appl. Cryst.
(1992).
25
,
648
doi: 10.1107/S0021889892005351
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Crystal setting by Bairsto's method
J. A. D. Jeffreys
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computer programs
J. Appl. Cryst.
(1992).
25
,
648-652
doi: 10.1107/S0021889892004667
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QUASI
2
D
: a program written to demonstrate quasiperiodicity and phason fluctuation
T. R. Welberry
,
A. Lee
and
K. Owen
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laboratory notes
J. Appl. Cryst.
(1992).
25
,
652-653
doi: 10.1107/S0021889892004655
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Microcomputer-based acquisition system for the Philips PW1050 powder diffractometer
M. W. Grigg
,
A. Keating
,
A. Brockwell
and
Z. Barnea
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fast communications
J. Appl. Cryst.
(1992).
25
,
654-657
doi: 10.1107/S0021889892007076
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Valence-contrast studies by resonant diffraction with synchrotron radiation; the rôle of X-ray absorption measurements
A. P. Wilkinson
and
A. K. Cheetham
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J. Appl. Cryst.
(1992).
25
,
657-660
doi: 10.1107/S0021889892007490
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High-resolution direct observation of the carbon-cage structure of C
60
buckyballs
A. V. Narlikar
,
S. B. Samanta
,
P. K. Dutta
,
L. S. Grigoryan
and
A. K. Majumdar
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letters to the editor
J. Appl. Cryst.
(1992).
25
,
661-662
doi: 10.1107/S0021889892006290
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Free
About the primitivity theorem
Y. Le Page
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computer program abstracts
J. Appl. Cryst.
(1992).
25
,
663
doi: 10.1107/S0021889892002474
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CSDSHL
- a utility for converting Cambridge Structural Database atom coordinate files to
SHELX
format
D. R. Powell
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crystallographers
J. Appl. Cryst.
(1992).
25
,
663
doi: 10.1107/S0021889892008483
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Free
Crystallographers
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new commercial products
J. Appl. Cryst.
(1992).
25
,
663-664
doi: 10.1107/S0021889892099850
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