Journal of Applied Crystallography Journal of Applied
Crystallography

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JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

Volume 26| Part 6

ISSN: 1600-5767

December 1993 issue

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research papers

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The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. I. Derivation of a simple expression for the full width at half-maximum

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The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. II. The half-widths of YIG and Si single crystals

E. Rossmanith, M. Werner, G. Kumpat, G. Ulrich and K. Eichhorn

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Characterization of an image-plate detector used for quantitative small-angle-scattering studies

F. Né, D. Gazeau, J. Lambard, P. Lesieur, T. Zemb and A. Gabriel

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Intensity enhancement in asymmetric diffraction with parallel-beam synchrotron radiation

H. Toraya, T. C. Huang and Y. Wu

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Electron diffraction from phospholipids – an approximate correction for dynamical scattering and tests for a correct phase determination

D. L. Dorset, M. P. McCourt, W. F. Tivol and J. N. Turner

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A direct method of beam-height correction in small-angle X-ray scattering

M. A. Singh, S. S. Ghosh and R. F. Shannon Jnr

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Automatic processing of rotation diffraction data from crystals of initially unknown symmetry and cell constants

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An improved deviation parameter for the simulation of dynamical X-ray diffraction on epitaxic heterostructures

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Interpretation of the diffuse scattering close to Bragg peaks by X-ray topography

P. F. Fewster and N. L. Andrew

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Evaluation of 3D small-angle scattering from non-spherical particles in single crystals

P. Fratzl, F. Langmayr and O. Paris

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Structure-refinement program for disordered carbons

H. Shi, J. N. Reimers and J. R. Dahn

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short communications

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The importance of, and a method for, optimizing the calculation of rotation functions

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A fast and portable microspectrophotometer for protein crystallography

A. Hadfield and J. Hajdu

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Improved calibtration curve for the Sm²⁺:BaFCl pressure sensor

P. Comodi and P. F. Zanazzi

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Remeasurement of the profile of the characteristic Cu Kα emission line with high precision and accuracy. Erratum

J. Härtwig, G. Hölzer, J. Wolf and E. Förster

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crystallographers

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Crystallographers

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international union of crystallography

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Education and Teaching in Crystallography. Call for papers

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Prices of Acta Crystallographica and Journal of Applied Crystallography

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new commercial products

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New Commercial Products

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