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Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
Volume 27| Part 2
ISSN: 1600-5767

April 1994 issue

Highlighted illustration

Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

research papers

J. Appl. Cryst. (1994). 27, 133-139
doi: 10.1107/S0021889893008519
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Two open-flow cryostats for macromolecular crystallography

T. Teng, W. Schildkamp, P. Dolmer and K. Moffat
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J. Appl. Cryst. (1994). 27, 140-145
doi: 10.1107/S0021889893009094
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High-resolution electron-microscopic studies of the polymorphs in Ag2±δSe films

T. Okabe and K. Ura
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J. Appl. Cryst. (1994). 27, 146-150
doi: 10.1107/S0021889893007903
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The role of nucleation site in determining the morphology of the product crystal in a structural phase transition

I. Agmon and M. Kaftory
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J. Appl. Cryst. (1994). 27, 151-154
doi: 10.1107/S0021889893007897
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High-temperature (323–1323 K) furnace design for a transmission powder diffractometer

N. E. Brown and W. Weigel
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J. Appl. Cryst. (1994). 27, 155-158
doi: 10.1107/S0021889893007964
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Measurement of the static disorder contribution to the temperature factor in cubic stabilized ZrO2

D. N. Argyriou
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J. Appl. Cryst. (1994). 27, 159-163
doi: 10.1107/S0021889893014141
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High-resolution diffraction at synchrotron sources: correction for counting losses

C. S. G. Cousins
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J. Appl. Cryst. (1994). 27, 164-176
doi: 10.1107/S0021889893007605
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New methods for alignment of instrumentation for residual-stress measurements by means of neutron diffraction

P. C. Brand and H. J. Prask
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J. Appl. Cryst. (1994). 27, 177-189
doi: 10.1107/S0021889893007782
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Particular solutions of the PDF-to-ODF inversion problem of texture analysis by large-scale mathematical programming

H. Schaeben and J. J. Fundenberger
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short communications

J. Appl. Cryst. (1994). 27, 190-192
doi: 10.1107/S0021889893008684
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The use of Image Plates for Laue diffraction with synchrotron radiation with olivine single-crystal studies as an example

H. Euler, R. Gilles and G. Will
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J. Appl. Cryst. (1994). 27, 192-195
doi: 10.1107/S0021889893009835
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Anomalous X-ray scattering at the sulfur edge of poly(3-octylthiophene)

J. Mårdalen, C. Riekel and H. Müller
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J. Appl. Cryst. (1994). 27, 195-197
doi: 10.1107/S0021889893011057
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Remarks on four-circle angle calculations for surface diffraction

F. H. Cano and M. Martínez-Ripoll
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laboratory notes

J. Appl. Cryst. (1994). 27, 198-199
doi: 10.1107/S0021889893006740
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An inexpensive technique for handling solvent-dependent crystals

S. R. Drake
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J. Appl. Cryst. (1994). 27, 199
doi: 10.1107/S0021889893009173
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Crystallization in a laboratory chamber furnace

B. Čabrić, T. Pavlović and B. Žižić
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computer program abstracts

J. Appl. Cryst. (1994). 27, 200
doi: 10.1107/S0021889893007885
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ABSPSI – stand-alone analytical absorption calculation using crystal-defined ψ values for specification of ray directions

N. W. Alcock and P. J. Marks
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J. Appl. Cryst. (1994). 27, 200-201
doi: 10.1107/S0021889893009537
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SCATTER – a program for calculating atomic scattering-factor coefficients for electrons

T. A. Ceska
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J. Appl. Cryst. (1994). 27, 201-202
doi: 10.1107/S0021889893009574
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XRS-82 runs on PC386/486 computers

D. Mucha and W. Łasocha
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meeting reports

J. Appl. Cryst. (1994). 27, 202-204
doi: 10.1107/S002188989409970X
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Meeting Report

R. J. Cernik and G. J. Gainsford
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crystallographers

J. Appl. Cryst. (1994). 27, 204
doi: 10.1107/S0021889894099693
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Crystallographers

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new commercial products

J. Appl. Cryst. (1994). 27, 204
doi: 10.1107/S0021889894099681
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new Commercial Products

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books received

J. Appl. Cryst. (1994). 27, 204
doi: 10.1107/S002188989409967X
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Growth of crystals. Vol 19. edited by E. I. Givargizov and S. A. Grinberg

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