issue contents

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

February 1995 issue

Highlighted illustration

Cover illustration: The observed X-ray diffuse scattering in the (h0l) section of 1,3-dibromo-2,5-diethyl-4,6-dimethylbenzene. Courtesy of T. R. Welberry and B. D. Butler.

international union of crystallography


J. Appl. Cryst. (1995). 28, 1-6
doi: 10.1107/S0021889895099699

research papers


J. Appl. Cryst. (1995). 28, 7-13
doi: 10.1107/S002188989400467X
link to html
The possibilities of applying neutron time-of-flight Laue diffraction in monitoring structural changes in single crystals are considered. Simulations show that useful structural information can be obtained from single data frames (single shots), leading to a substantial improvement in the time resolution for following such changes.

J. Appl. Cryst. (1995). 28, 14-19
doi: 10.1107/S0021889894006333
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Simple methods are presented of correcting the wide-range X-ray diffraction patterns of diffusely scattering materials for distortion due to finite speciment length, high transparency, strong Compton scattering and contributions from small-angle scattering.

J. Appl. Cryst. (1995). 28, 20-25
doi: 10.1107/S0021889894007788
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The use of multilayer coatings in the classical Ioffe diffraction-grating neutron interferometer is proposed. This interferometer combines the properties of two periodic structures: dispersion by a diffraction grating and high reflectivity because of the multilayer coating.

J. Appl. Cryst. (1995). 28, 26-32
doi: 10.1107/S0021889894008320
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A new differential thermal analyser has been developed suitable for combining with time-resolved X-ray equipment. The use of this instrument with simultaneous SAXS, SAXS/WAXS and energy-dispersive powder diffraction experiments is described.

J. Appl. Cryst. (1995). 28, 33-37
doi: 10.1107/S0021889894007776
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A real-time X-ray diffraction study of staging phase transitions in CuCl2-intercalated graphite during deintercalation in ambient air has been carried out. A position-sensitive detector was used to perform the real-time quantitative phase analysis at different stages of the deintercalation reaction.

J. Appl. Cryst. (1995). 28, 38-42
doi: 10.1107/S0021889894008319
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Direct slit-collimation correction of small-and wide-angle scattering data from semicrystalline materials on the basis of Akima polynomials and slit functions renders Soller-slit collimation unnecessary. A gain factor of four or five in scattered intensity results.

J. Appl. Cryst. (1995). 28, 43-48
doi: 10.1107/S0021889894008824
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A polynomial-based spatial-distortion correction, derived from the diffraction pattern, has been used to enable good spot-position prediction for processing Laue diffraction data recorded on an image plate.

short communications


J. Appl. Cryst. (1995). 28, 49-52
doi: 10.1107/S0021889894009635
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The form of the transmission factor for sample geometries encountered in X-ray and neutron fibre diffraction studies is considered.

computer programs


J. Appl. Cryst. (1995). 28, 53-56
doi: 10.1107/S0021889894009428
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The paper describes an algorithm for an empirical post-solution absorption correction. Only Fobs and structural parameters (isotropic level) are required.

fast communications


J. Appl. Cryst. (1995). 28, 57-60
doi: 10.1107/S0021889894010101
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An ion-implanted Si(111) sample with lateral periodic superstructure has been studied by high-resolution triple-crystal diffractometry at the Australian National Beamline Facility of the Photon Factory synchrotron. Detailed analysis of the data will yield a map, as a function of lateral position and depth, of the lattice distortions perpendicular to the sample surface.

J. Appl. Cryst. (1995). 28, 61-64
doi: 10.1107/S0021889894011118
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Fine-scale dark streaks, only a few arc seconds in angular width, are discovered within the area of overlap at Kossel-line intersections. They delineate loci of coherent multiple diffraction and impose potentially useful markers on the broad-line divergent-beam pattern.

computer program abstracts


J. Appl. Cryst. (1995). 28, 65
doi: 10.1107/S0021889894010642
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SORTX generates a stick model of the atoms or peaks in a SHELX file on a PC screen. Atoms are selected and renamed or deleted using the mouse.

J. Appl. Cryst. (1995). 28, 65-66
doi: 10.1107/S0021889894010630
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Interactive computer programs (PARSET and PARSYM) are described that create input files for programs MORGUE and PARAM, which perform neutron powder structure refinement solution with rigid-body positional and thermal-motion constraints.

crystallographers


J. Appl. Cryst. (1995). 28, 66
doi: 10.1107/S0021889894011830

international union of crystallography


J. Appl. Cryst. (1995). 28, 66-67
doi: 10.1107/S0021889894014226

notes and news


J. Appl. Cryst. (1995). 28, 67
doi: 10.1107/S0021889895099687

new commercial products


J. Appl. Cryst. (1995). 28, 67-68
doi: 10.1107/S0021889895099675

books received



J. Appl. Cryst. (1995). 28, 68
doi: 10.1107/S0021889895099651


J. Appl. Cryst. (1995). 28, 68
doi: 10.1107/S0021889895099638
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