view article
Figure 10
Dolling's dispersion curve for the [100] direction in silicon (solid lines) and the loci of allowable ω and Q values (dotted lines) on D22 with a sample-to-detector distance of 1.5 m. The upper and lower dotted lines correspond to scattering angles (2θ) of 0 and 24.3°, respectively. The boundaries of the experimentally determined maximum and minimum energy are indicated by the dot–dash lines.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39| Part 1| February 2006| Pages 46-52
https://doi.org/10.1107/S0021889805033698
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS