Energy separation of neutrons scattered at small angles from silicon using time-of-flight techniques

Cheung, J.Y.; Stewart, R.J.; May, R.P.

doi:10.1107/S0021889805033698

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 13
The radially averaged differential scattering cross sections from a silicon single crystal containing a low concentration of SiO₂ precipitates. The square symbols represent the total scattering (elastic + inelastic), the triangular symbols the inelastic scattering and the diamond symbols the elastic scattering.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 39| Part 1| February 2006| Pages 46-52

https://doi.org/10.1107/S0021889805033698

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