view article
Figure 14
The radially averaged differential scattering cross sections from a silicon single crystal containing a low concentration of SiO2 precipitates (A) compared with that of a control silicon sample containing no SiO2 precipitates (B). The square symbols represent the total scattering (elastic + inelastic) from sample A and the triangular symbols the total scattering from sample B. The diamond symbols represent the elastic scattering from sample A and the crosses the total scattering from sample A minus the total scattering from sample B.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39| Part 1| February 2006| Pages 46-52
https://doi.org/10.1107/S0021889805033698
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS