Energy separation of neutrons scattered at small angles from silicon using time-of-flight techniques

Cheung, J.Y.; Stewart, R.J.; May, R.P.

doi:10.1107/S0021889805033698

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Schematic diagram of the D22 instrument with a time-of-flight chopper. L are distances and in the subscripts C refers to the chopper, S to the sample, D to the detector and TOT to the total flight path. ΔD refers to the detector thickness and ΔS to the sample thickness.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 39| Part 1| February 2006| Pages 46-52

https://doi.org/10.1107/S0021889805033698

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