Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 1
Final observed (points), calculated (lines), and difference profiles for the Rietveld refinement of the quaternary alloy Zn
0.6
Mn
0.4
In
2
S
4
from high-resolution powder diffraction data. (
a
) Data from 5 to 20° 2
θ
. (
b
) Data from 20 to 45° 2
θ
.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39
|
Part 1
|
February 2006
|
Pages 1-5
https://doi.org/10.1107/S0021889805032656
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