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Figure 11
(a) High-resolution beam profile recorded with the FReLoN detector at a sample–detector distance of 30.8 m. (b) Corresponding horizontal and vertical profiles, which can be described by Gaussian functions with the FWHM values indicated.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 51| Part 6| December 2018| Pages 1511-1524
https://doi.org/10.1107/S1600576718012748
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