In-house texture measurement using a compact neutron source

Xu, P.G.; Ikeda, Y.; Hakoyama, T.; Takamura, M.; Otake, Y.; Suzuki, H.

doi:10.1107/S1600576720002551

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Incoherent vanadium and background scattering characteristics of all 16 divided panel regions, measured with a Ø15 mm × 40 mm vanadium–nickel alloy and without any sample, respectively.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 53| Part 2| April 2020| Pages 444-454

https://doi.org/10.1107/S1600576720002551

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