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Figure 2
CALM-derived (hollow circles) and fitted (black dots) lattice parameter offsets for 249 different compounds. Both trace positions and the PC are known, and the error bars describe σhkl resulting from the band width distribution in each pattern. [{\overline Z}] is derived by the mean of the products between the mass fraction ci and atomic number Zi.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 56| Part 2| April 2023| Pages 361-366
https://doi.org/10.1107/S1600576723000146
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