Demonstration of neutron time-of-flight diffraction with an event-mode imaging detector

Jäger, T.T.; Losko, A.S.; Wolfertz, A.; Schmidt, S.; Bertelsen, M.; Khaplanov, A.; Agnew, S.R.; Funama, F.; Morgano, M.; Roth, M.; Gochanour, J.R.; Long, A.M.; Lutterotti, L.; Vogel, S.C.

doi:10.1107/S1600576724004448

Journal of Applied Crystallography Journal of Applied
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Figure 3
Intensity in arbitrary units versus 2ϑ at an arbitrary TOF of 3.72 ms and L₂ = 83 cm simulated with McStas is shown in blue. One of the Gaussian fits used to derive the resolution as a function of 2ϑ is depicted in orange.

JOURNAL OF
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ISSN: 1600-5767

Volume 57| Part 4| August 2024| Pages 1107-1114

https://doi.org/10.1107/S1600576724004448

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