Demonstration of neutron time-of-flight diffraction with an event-mode imaging detector

Jäger, T.T.; Losko, A.S.; Wolfertz, A.; Schmidt, S.; Bertelsen, M.; Khaplanov, A.; Agnew, S.R.; Funama, F.; Morgano, M.; Roth, M.; Gochanour, J.R.; Long, A.M.; Lutterotti, L.; Vogel, S.C.

doi:10.1107/S1600576724004448

Journal of Applied Crystallography Journal of Applied
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Figure 6
(a) Contour plot produced by MAUD of diffracted intensity as a function of d spacing for 48 superpixels of 8 × 32 size, each shown as horizontal stripes, as raw data (bottom panel) and after the fit (top panel). (b) Integrated histogram of all 48 superpixels of 8 × 32 size after the Rietveld fit (red curve) to silicon powder data (black dots) of all individual histograms, with the difference curve below and silicon reflection positions marked by tick marks. (c) Contour plot produced by MAUD for 2688 superpixels of 1 × 8 size. (d) Integrated histogram of all 2688 superpixels of 1 × 8 size. See text for more information.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 4| August 2024| Pages 1107-1114

https://doi.org/10.1107/S1600576724004448

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