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Figure 1
A comparison of the smeared [I_{\rm exp}(Q)] (depicted by black curves), obtained through the convolution of resolution-free scattering intensity I(Q) (represented by black dashed curves) and resolution function [R(Q-Q_{\rm m})] (shown as green curves), characterized by the peak width [\sigma_{Q} = 2.24\times 10^{-2}Q_{\rm m}]. Here, [Q_{\rm m}] represents the maximum position of [I_{\rm exp}(Q)], and the peak widths of I(Q) are [\sigma_{Q}/1.25], [\sigma_{Q}/1.45], [\sigma_{Q}/1.65] and [\sigma_{Q}/1.85] in panels (a), (b), (c) and (d), respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025|
https://doi.org/10.1107/S1600576725004212
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