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Figure 1
Schematic of the NS-SANS geometry for a vertical reflection plane. The coordinate system is chosen such that the sample surface lies in the xy plane and the scattering plane of the detector lies in the yz plane. A beam of monochromatic and highly collimated neutrons propagates along the x direction and impinges onto the sample surface at a shallow incidence angle αi greater than or equal to the critical angle αc of the sample. In this geometry, the sample is fully illuminated and the bulk ordering of the sample is probed. The resulting detector image will be sensitive to lateral and vertical correlations in Qy and Qz, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1455-1461
https://doi.org/10.1107/S1600576725005503
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