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Figure 1
(Top) Schematic of the iMATERIA instrument, showing four detector blocks for small-angle, low-angle, 90° and backward detectors. (Bottom) Simultaneous measurements of small-angle scattering and backward diffraction.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1360-1372
https://doi.org/10.1107/S1600576725004479
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