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Figure 16
(a) Schematic of triple simultaneous analysis, combining SANS, NR and prompt γ-ray measurements, which will be installed at the iMATERIA instrument by the end of 2025. (b) Schematic of the second sample stage for prompt γ-ray measurements behind the SANS detector (future plan).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 58| Part 4| August 2025| Pages 1360-1372
https://doi.org/10.1107/S1600576725004479
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